{"created":"2023-05-15T11:57:48.490578+00:00","id":3572,"links":{},"metadata":{"_buckets":{"deposit":"2967b190-e058-4f57-84d4-2d0cf71097cc"},"_deposit":{"created_by":3,"id":"3572","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"3572"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00003572","sets":["17:18"]},"author_link":["1143"],"item_22_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Research on Advanced VLSI Test for Avoiding Signal Degradation"}]},"item_22_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-05-18","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{}]}]},"item_22_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究期間：2007～2009, 研究種目：基盤研究（C）, 科学研究費補助金研究成果報告書","subitem_description_type":"Other"}]},"item_22_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"九州工業大学"}]},"item_22_select_60":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"no"}]},"item_22_text_37":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学情報工学研究院情報創成工学研究系"}]},"item_22_text_58":{"attribute_name":"科研課題番号","attribute_value_mlt":[{"subitem_text_value":"19500047"}]},"item_22_version_type_59":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2010-11-11"}],"displaytype":"detail","filename":"19500047seika.pdf","filesize":[{"value":"234.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"19500047seika.pdf","url":"https://kyutech.repo.nii.ac.jp/record/3572/files/19500047seika.pdf"},"version_id":"5e94ad0e-1be5-4830-b955-189e9908d49b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"LSIテスト","subitem_subject_scheme":"Other"},{"subitem_subject":"高信頼化","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"次世代ＬＳＩのための信号劣化回避型テスト方式に関する研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"次世代ＬＳＩのための信号劣化回避型テスト方式に関する研究"}]},"item_type_id":"22","owner":"3","path":["18"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-11-11"},"publish_date":"2010-11-11","publish_status":"0","recid":"3572","relation_version_is_last":true,"title":["次世代ＬＳＩのための信号劣化回避型テスト方式に関する研究"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T08:51:25.647182+00:00"}