{"created":"2023-05-15T11:58:29.157350+00:00","id":4519,"links":{},"metadata":{"_buckets":{"deposit":"d2cbc413-4dfa-4827-9dfa-a2aca0ea4a78"},"_deposit":{"created_by":3,"id":"4519","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4519"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004519","sets":["15:20"]},"author_link":["16176","16211","16212"],"item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-06","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"342","bibliographicPageStart":"339","bibliographic_titles":[{"bibliographic_title":"2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2016)"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Current filamentaion effect with dynamic avalanche during turn-off transient in IGBT has been discussed for years. In the prior papers, the possibility of device failure has been reported based on TCAD simulation and simulation results have shown that variety of filamentation phenomena exist for conditions assumed in each simulation. It is discussed in this paper, for the first time, that the relationship of filamentation current concentration strength to device design parameters and categorizes filamentation phenomena, introducing current filamentation ratio (CFR). In the paper, guidelines for appropriate mesh pattern selection are also described to ensure the validity of simulation results.","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ISPSD 2016 28th International Symposium on Power Semiconductor Devices and ICs., Jun 12-16, 2016, Žofín Palace, Prague, Czech Republic","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"IEEE"}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_text_37":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyusyu Institute of Technology"},{"subitem_text_value":"Kyusyu Institute of Technology"},{"subitem_text_value":"Green Electronics Research Institute"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"5522"}]},"item_23_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shiba, Yuji"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsukuda, Masanori"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-09-13"}],"displaytype":"detail","filename":"nperc67.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc67.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4519/files/nperc67.pdf"},"version_id":"dd50d51a-9224-4d56-a99d-50a6fe90d3bd"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"IGBT","subitem_subject_scheme":"Other"},{"subitem_subject":"dynamic avalanche","subitem_subject_scheme":"Other"},{"subitem_subject":"current filamentation","subitem_subject_scheme":"Other"},{"subitem_subject":"mesh","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"IGBT Avalanche Current Filamentaion Ratio: Precise Simulations on Mesh and Structure Effect","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"IGBT Avalanche Current Filamentaion Ratio: Precise Simulations on Mesh and Structure Effect"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-09-13"},"publish_date":"2016-09-13","publish_status":"0","recid":"4519","relation_version_is_last":true,"title":["IGBT Avalanche Current Filamentaion Ratio: Precise Simulations on Mesh and Structure Effect"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T10:49:03.422232+00:00"}