@inproceedings{oai:kyutech.repo.nii.ac.jp:00004521,
 author = {真辺, 航 and 原田, 翔平 and 司馬, 悠地 and Omura, Ichiro and 大村, 一郎 and 附田, 正則},
 book = {電力技術/電力系統技術/半導体電力変換 合同研究会},
 month = {Mar},
 note = {We discussed applying the open circuit voltage decay (OCVD) method to measure carrier lifetime of power devices. A deviation of the carrier lifetime was confirmed by TCAD simulation on low level injection conditions. Introducing a transition model of carrier, a high accuracy measurement could be achieved., 電力技術／電力系統技術／半導体電力変換技術合同研究会, 3月8日-9日, 2016年, 九州工業大学　戸畑キャンパス, 福岡県},
 publisher = {社団法人電気学会},
 title = {OCVD法での接合容量の効果：電流成分を含んだモデル式の構築},
 volume = {PE-16},
 year = {2016},
 yomi = {オオムラ, イチロウ}
}