{"created":"2023-05-15T11:58:29.283786+00:00","id":4521,"links":{},"metadata":{"_buckets":{"deposit":"b3c49c99-7d48-4afc-b782-856aeedfc239"},"_deposit":{"created_by":3,"id":"4521","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4521"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004521","sets":["15:20"]},"author_link":["16220","16227","16225","16224","16176","16222","16221","16229","16226"],"item_23_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Effect of the Junction Capacitance by Open Circuit Voltage Decay Method : Construction of the Model Including Current Component"}]},"item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-03","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"PE-16-043","bibliographicVolumeNumber":"PE-16","bibliographic_titles":[{"bibliographic_title":"電力技術/電力系統技術/半導体電力変換 合同研究会"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We discussed applying the open circuit voltage decay (OCVD) method to measure carrier lifetime of power devices. A deviation of the carrier lifetime was confirmed by TCAD simulation on low level injection conditions. Introducing a transition model of carrier, a high accuracy measurement could be achieved.","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"電力技術／電力系統技術／半導体電力変換技術合同研究会, 3月8日-9日, 2016年, 九州工業大学　戸畑キャンパス, 福岡県　","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"16225","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Manabe, Wataru"}]},{"nameIdentifiers":[{"nameIdentifier":"16226","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Harada, Shohei"}]},{"nameIdentifiers":[{"nameIdentifier":"16227","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Shiba, Yuji"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{"nameIdentifier":"16176","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10510670","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000010510670"},{"nameIdentifier":"7003814580","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003814580"},{"nameIdentifier":"69","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/69_ja.html"}],"names":[{"name":"Omura, Ichiro","nameLang":"en"},{"name":"大村, 一郎","nameLang":"ja"},{"name":"オオムラ, イチロウ","nameLang":"ja-Kana"}]},{"nameIdentifiers":[{"nameIdentifier":"16229","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Tsukuda, 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