{"created":"2023-05-15T11:58:30.737799+00:00","id":4549,"links":{},"metadata":{"_buckets":{"deposit":"71fe652f-df07-4e82-9ce3-9cbe250e3625"},"_deposit":{"created_by":3,"id":"4549","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4549"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004549","sets":["15:20"]},"author_link":["16366","16367","16368","16369","16176"],"control_number":"4549","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1943-653X","bibliographicPageEnd":"350","bibliographicPageStart":"347","bibliographic_titles":[{"bibliographic_title":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"4.5 kV IEGT turn-on loss reduction is experimentally and numerically achieved by employing the proposed simple two step gate drive method without affecting PiN diode reverse recovery performance. It was found that 14% of turn-on loss is reduced only by the simple method. This study determines, for the first time, the optimum gate driving in the two step gate drive which can reduce IEGT turn-on loss maximally without affecting PiN diode reverse recovery performance by TCAD simulation. The method is simple yet effective for reducing switching loss of high voltage IEGT.","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD), May 26-30, 2013, Ishikawa Ongakudo, Kanazawa. Japan.","subitem_description_type":"Other"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ISPSD.2013.6694419","subitem_relation_type_select":"DOI"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"IEEE"}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"5558"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Miki, Yamato","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16366","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mukunoki, Makoto","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16367","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsuyoshi, Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16368","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsukuda, Masanori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16369","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{"familyName":"Omura","familyNameLang":"en"},{"familyName":"大村","familyNameLang":"ja"},{"familyName":"オオムラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Ichiro","givenNameLang":"en"},{"givenName":"一郎","givenNameLang":"ja"},{"givenName":"イチロウ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"16176","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10510670","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000010510670"},{"nameIdentifier":"7003814580","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003814580"},{"nameIdentifier":"69","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/69_ja.html"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-09-13"}],"displaytype":"detail","filename":"nperc29.pdf","filesize":[{"value":"452.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc29.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4549/files/nperc29.pdf"},"version_id":"ee380ed3-b85f-4e8e-8adc-b473e8bb27e2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"component","subitem_subject_scheme":"Other"},{"subitem_subject":"IGB","subitem_subject_scheme":"Other"},{"subitem_subject":"IEGT","subitem_subject_scheme":"Other"},{"subitem_subject":"PiN diode","subitem_subject_scheme":"Other"},{"subitem_subject":"switching loss","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"High Speed Turn-on Gate Driving for 4.5kV IEGT without Increase in PiN Diode Recovery Current","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"High Speed Turn-on Gate Driving for 4.5kV IEGT without Increase in PiN Diode Recovery Current","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2016-09-13"},"publish_date":"2016-09-13","publish_status":"0","recid":"4549","relation_version_is_last":true,"title":["High Speed Turn-on Gate Driving for 4.5kV IEGT without Increase in PiN Diode Recovery Current"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2025-06-23T05:24:07.826484+00:00"}