@inproceedings{oai:kyutech.repo.nii.ac.jp:00004566,
 author = {川神, 圭一朗 and 附田, 正則 and 高濱, 健一 and Omura, Ichiro and 大村, 一郎},
 book = {電気学会研究会資料. EDD, 電子デバイス研究会},
 month = {Oct},
 note = {Avalanche induced oscillation phenomena during reverse recovery of power PiN diodes are investigated for the purpose of “Design for EMI”. The oscillation phenomena are the major barrier to improve power diode performance since the oscillation can cause serious EMI, affecting power electronics system reliability. The mechanism of the oscillation is precisely modelled under various diode structures and current ranges. The result will contribute to the design methodology to attain stable yet high performance diodes and power electronics systems., 電子デバイス/半導体電力変換合同研究会, 10月27日-28日, 2011年, くにびきメッセ, 島根県},
 publisher = {社団法人電気学会},
 title = {PiNダイオードの逆回復時高周波振動の検討},
 volume = {EDD-11},
 year = {2011},
 yomi = {オオムラ, イチロウ}
}