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IGBT chip current imaging system by scanning local magnetic field
http://hdl.handle.net/10228/5788
http://hdl.handle.net/10228/5788cf2f69a4-fba6-4f53-9075-aa9357306b36
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
nperc31.pdf (640.5 kB)
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| Item type | 学術雑誌論文 = Journal Article(1) | |||||||||||||
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| 公開日 | 2016-09-13 | |||||||||||||
| 資源タイプ | ||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||
| 資源タイプ | journal article | |||||||||||||
| タイトル | ||||||||||||||
| タイトル | IGBT chip current imaging system by scanning local magnetic field | |||||||||||||
| 言語 | en | |||||||||||||
| 言語 | ||||||||||||||
| 言語 | eng | |||||||||||||
| 著者 |
Shiratsuchi, H.
× Shiratsuchi, H.× Matsushita, K.× 大村, 一郎
WEKO
16176
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| 抄録 | ||||||||||||||
| 内容記述タイプ | Abstract | |||||||||||||
| 内容記述 | An IGBT / power diode current distribution imaging system was demonstrated. This system can capture current redistribution or oscillation inside or among chips on a DBC-level sub-module. It can perform failure analysis of power semiconductors by detecting problems such as nonuniform current distribution between bonding wires. The system scans the chip’s shape using a laser sensor and then records the local magnetic field near the bonding wire using a 4-axis robot coil sensor. The coil sensor has two pair of Cu patterned spiral coils symmetrically arranged on both sides of a 60-μm-thick polyimide film. The system enables the analysis of destructive current concentrations of the entire chip, among chips or a part of the chip under high current or high voltage switching conditions, without making any changes or disassembling the chip connections. | |||||||||||||
| 言語 | en | |||||||||||||
| 備考 | ||||||||||||||
| 内容記述タイプ | Other | |||||||||||||
| 内容記述 | 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Schedule, September 30-October 4, 2013, Venue, Arcachon, France | |||||||||||||
| 書誌情報 |
en : Microelectronics Reliability 巻 53, 号 9-11, p. 1409-1412, 発行日 2013-10-12 |
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| 出版社 | ||||||||||||||
| 出版者 | Elsevier | |||||||||||||
| DOI | ||||||||||||||
| 関連タイプ | isVersionOf | |||||||||||||
| 識別子タイプ | DOI | |||||||||||||
| 関連識別子 | https://doi.org/10.1016/j.microrel.2013.07.092 | |||||||||||||
| NCID | ||||||||||||||
| 収録物識別子タイプ | NCID | |||||||||||||
| 収録物識別子 | AA11538014 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||||
| 収録物識別子 | 0026-2714 | |||||||||||||
| ISSN | ||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||
| 収録物識別子 | 1872-941X | |||||||||||||
| 著作権関連情報 | ||||||||||||||
| 権利情報 | Elsevier | |||||||||||||
| 出版タイプ | ||||||||||||||
| 出版タイプ | AM | |||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||||
| 査読の有無 | ||||||||||||||
| 値 | yes | |||||||||||||
| 連携ID | ||||||||||||||
| 値 | 5591 | |||||||||||||
