{"created":"2023-05-15T11:58:31.572839+00:00","id":4569,"links":{},"metadata":{"_buckets":{"deposit":"c89ff4ae-80c5-407c-9589-7404ad2964a6"},"_deposit":{"created_by":3,"id":"4569","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4569"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004569","sets":["8:24"]},"author_link":["16469","16470","16176"],"control_number":"4569","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-10-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9-11","bibliographicPageEnd":"1412","bibliographicPageStart":"1409","bibliographicVolumeNumber":"53","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An IGBT / power diode current distribution imaging system was demonstrated. This system can capture current redistribution or oscillation inside or among chips on a DBC-level sub-module. It can perform failure analysis of power semiconductors by detecting problems such as nonuniform current distribution between bonding wires. The system scans the chip’s shape using a laser sensor and then records the local magnetic field near the bonding wire using a 4-axis robot coil sensor. The coil sensor has two pair of Cu patterned spiral coils symmetrically arranged on both sides of a 60-μm-thick polyimide film. The system enables the analysis of destructive current concentrations of the entire chip, among chips or a part of the chip under high current or high voltage switching conditions, without making any changes or disassembling the chip connections.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Schedule, September 30-October 4, 2013, Venue, Arcachon, France","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2013.07.092","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Elsevier"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA11538014","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"1872-941X","subitem_source_identifier_type":"EISSN"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"5591"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shiratsuchi, H.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16469","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsushita, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"16470","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{"familyName":"Omura","familyNameLang":"en"},{"familyName":"大村","familyNameLang":"ja"},{"familyName":"オオムラ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Ichiro","givenNameLang":"en"},{"givenName":"一郎","givenNameLang":"ja"},{"givenName":"イチロウ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"16176","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10510670","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000010510670"},{"nameIdentifier":"7003814580","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003814580"},{"nameIdentifier":"69","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/69_ja.html"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-09-13"}],"displaytype":"detail","filename":"nperc31.pdf","filesize":[{"value":"640.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc31.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4569/files/nperc31.pdf"},"version_id":"9e0818e5-0f1a-47ff-a187-62bd29b35247"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"IGBT chip current imaging system by scanning local magnetic field","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"IGBT chip current imaging system by scanning local magnetic field","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2016-09-13"},"publish_date":"2016-09-13","publish_status":"0","recid":"4569","relation_version_is_last":true,"title":["IGBT chip current imaging system by scanning local magnetic field"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-08-09T07:23:33.223797+00:00"}