@article{oai:kyutech.repo.nii.ac.jp:00004797,
 author = {Nozaki, Yukishige and Masui, Hirokazu and 増井, 博一 and Toyoda, Kazuhiro and 豊田, 和弘 and Cho, Mengu and 趙, 孟佑 and Watabe, Hirokazu},
 journal = {Transactions of the Japan Society for Aeronautical and Space Sciences, Space Technology Japan},
 month = {Mar},
 note = {High-efficiency triple-junction (TJ) solar cells with monolithic diodes (MD) are being used for recent spacecraft solar arrays. Because the cell-to-cell inter-connector is usually connected on the MD pad, studying the effects of electrostatic discharge (ESD) on MD is necessary. Laboratory testing of two types of MD functions revealed that the weaker design was damaged by an energy discharge of 0.8J. With an external circuit simulating flight solar array, however, discharge as large as 9.3J didn't destroy the solar cell. Based on the test results, it was concluded that MD solar cells have sufficient resistance against ESD in orbit., 26th International Symposium on Space Technology and Science, June 2-6, 2008, Hamamatsu, Japan},
 pages = {11--17},
 title = {ESD Ground Testing of Triple-Junction Space Solar Cells with Monolithic Diodes},
 volume = {7},
 year = {2009},
 yomi = {マスイ, ヒロカズ and トヨダ, カズヒロ and チヨウ, メンウ}
}