{"created":"2023-05-15T11:58:41.252170+00:00","id":4797,"links":{},"metadata":{"_buckets":{"deposit":"8f40cf21-fd82-4633-8c47-78324e0f2bc8"},"_deposit":{"created_by":3,"id":"4797","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4797"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004797","sets":["8:24"]},"author_link":["17592","17583","17484","754","17596"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-03-19","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"17","bibliographicPageStart":"11","bibliographicVolumeNumber":"7","bibliographic_titles":[{"bibliographic_title":"Transactions of the Japan Society for Aeronautical and Space Sciences, Space Technology Japan"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High-efficiency triple-junction (TJ) solar cells with monolithic diodes (MD) are being used for recent spacecraft solar arrays. Because the cell-to-cell inter-connector is usually connected on the MD pad, studying the effects of electrostatic discharge (ESD) on MD is necessary. Laboratory testing of two types of MD functions revealed that the weaker design was damaged by an energy discharge of 0.8J. With an external circuit simulating flight solar array, however, discharge as large as 9.3J didn't destroy the solar cell. Based on the test results, it was concluded that MD solar cells have sufficient resistance against ESD in orbit.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"26th International Symposium on Space Technology and Science, June 2-6, 2008, Hamamatsu, Japan","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/72_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"社団法人日本航空宇宙学会"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.2322/tstj.7.11","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2009 The Japan Society for Aeronautical and Space Sciences"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1347-3840","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"NEC Toshiba Space Systems, Ltd."},{"subitem_text_value":"Department of Electrical Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"NEC Toshiba Space Systems, Ltd."}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"234"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nozaki, Yukishige"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Masui, Hirokazu","creatorNameLang":"en"},{"creatorName":"増井, 博一","creatorNameLang":"ja"},{"creatorName":"マスイ, ヒロカズ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Toyoda, Kazuhiro","creatorNameLang":"en"},{"creatorName":"豊田, 和弘","creatorNameLang":"ja"},{"creatorName":"トヨダ, カズヒロ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Cho, Mengu","creatorNameLang":"en"},{"creatorName":"趙, 孟佑","creatorNameLang":"ja"},{"creatorName":"チヨウ, メンウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Watabe, Hirokazu"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-08"}],"displaytype":"detail","filename":"LaSEINE-2008_11.pdf","filesize":[{"value":"611.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"LaSEINE-2008_11.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4797/files/LaSEINE-2008_11.pdf"},"version_id":"02317fde-96a5-4b76-a0ec-b93a4d673f90"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Solar Array","subitem_subject_scheme":"Other"},{"subitem_subject":"Space Charging","subitem_subject_scheme":"Other"},{"subitem_subject":"Solar Cell","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"ESD Ground Testing of Triple-Junction Space Solar Cells with Monolithic Diodes","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ESD Ground Testing of Triple-Junction Space Solar Cells with Monolithic Diodes"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-02-08"},"publish_date":"2017-02-08","publish_status":"0","recid":"4797","relation_version_is_last":true,"title":["ESD Ground Testing of Triple-Junction Space Solar Cells with Monolithic Diodes"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:23:33.449379+00:00"}