{"created":"2023-05-15T11:58:46.749173+00:00","id":4940,"links":{},"metadata":{"_buckets":{"deposit":"e987d58f-4a22-49c7-b938-1a4e8f618982"},"_deposit":{"created_by":3,"id":"4940","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4940"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004940","sets":["8:24"]},"author_link":["19858","754"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-04","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"7","bibliographicPageStart":"1","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"Transactions of the Japan Society for Aeronautical and Space Sciences, Aerospace Technology Japan"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The analysis and evaluation of spacecraft charging are important tasks related to spacecraft design. Plasma parameters and charging potential data are needed for charging and discharging predictions. A new type of electrostatic analyzer using two-stage parallel electrodes has been developed to measure the charging potential of a spacecraft over a wide range, from one volt to tens of kilovolts. The spacecraft charging potential is determined by analyzing the energy spectrum shift. A proof-of-concept model of the new electrostatic analyzer was tested in a vacuum chamber filled with Xe plasma. The experimental results agreed very well with the theoretical predictions. The device, made of two parallel plate electrodes, can measure the charging potential by scanning the electrode voltage over only one-tenth of the actual charging potential. The simple structure and low-voltage operation make the device suitable for operation on a small satellite.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/168_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"社団法人日本航空宇宙学会"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.2322/tastj.8.1","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2010 The Japan Society for Aeronautical and Space Sciences"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA0086707X","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0549-3811","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1884-0485","subitem_source_identifier_type":"ISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10017556"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering, Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"516"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kurahara,  Naomi"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Cho, Mengu","creatorNameLang":"en"},{"creatorName":"趙, 孟佑","creatorNameLang":"ja"},{"creatorName":"チヨウ, メンウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-19"}],"displaytype":"detail","filename":"TTJS-8-1-7.pdf","filesize":[{"value":"689.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TTJS-8-1-7.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4940/files/TTJS-8-1-7.pdf"},"version_id":"f36732f1-3e35-43d9-bebc-ce335207ada2"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Spacecraft Charging","subitem_subject_scheme":"Other"},{"subitem_subject":"Langmuir Probe","subitem_subject_scheme":"Other"},{"subitem_subject":"Electrostatic Analyzer","subitem_subject_scheme":"Other"},{"subitem_subject":"Plasma Measurement","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Verification of a Charging Potential Measurement Method using a Parallel Plate Electrostatic Analyzer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Verification of a Charging Potential Measurement Method using a Parallel Plate Electrostatic Analyzer"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-19"},"publish_date":"2017-04-19","publish_status":"0","recid":"4940","relation_version_is_last":true,"title":["Verification of a Charging Potential Measurement Method using a Parallel Plate Electrostatic Analyzer"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T06:37:13.505005+00:00"}