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By measuring the behavior of refraction of another infrared laser beam caused by the generated free carriers, we derive the distribution of the generated free carriers, to finally obtain the diffusion length and lifetime of the free carriers.","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"電子デバイス/半導体電力変換 合同研究会, 九州工業大学　戸畑キャンパス, 2016-11-14/2016-11-15","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"19885","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kaneta,  Hiroshi"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{"nameIdentifier":"16176","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10510670","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000010510670"},{"nameIdentifier":"7003814580","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7003814580"},{"nameIdentifier":"69","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/69_ja.html"}],"names":[{"name":"Omura, Ichiro","nameLang":"en"},{"name":"大村, 一郎","nameLang":"ja"},{"name":"オオムラ, イチロウ","nameLang":"ja-Kana"}]}]},"item_23_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"一般社団法人電気学会"}]},"item_23_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"一般社団法人電気学会"}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"no"}]},"item_23_text_37":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6097"}]},"item_23_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"金田,  寛"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-27"}],"displaytype":"detail","filename":"nperc70.pdf","filesize":[{"value":"652.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc70.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4945/files/nperc70.pdf"},"version_id":"f736913f-a28b-4e15-97b1-e411aadee545"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"パワーデバイス ","subitem_subject_scheme":"Other"},{"subitem_subject":"シリコンウェーハ ","subitem_subject_scheme":"Other"},{"subitem_subject":"評価","subitem_subject_scheme":"Other"},{"subitem_subject":"キャリアライフタイム","subitem_subject_scheme":"Other"},{"subitem_subject":"レーザー","subitem_subject_scheme":"Other"},{"subitem_subject":"屈折","subitem_subject_scheme":"Other"},{"subitem_subject":"キャリア濃度分布","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"平行デュアルレーザビーム法によるシリコンウェーハのバルクキャリア寿命評価技術","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"平行デュアルレーザビーム法によるシリコンウェーハのバルクキャリア寿命評価技術"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-27"},"publish_date":"2017-04-27","publish_status":"0","recid":"4945","relation_version_is_last":true,"title":["平行デュアルレーザビーム法によるシリコンウェーハのバルクキャリア寿命評価技術"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-10-25T10:48:47.440778+00:00"}