{"created":"2023-05-15T11:58:47.287355+00:00","id":4953,"links":{},"metadata":{"_buckets":{"deposit":"40bbab53-4a4e-47e9-b799-f482a93e34fc"},"_deposit":{"created_by":3,"id":"4953","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4953"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004953","sets":["8:24"]},"author_link":["28366","16176","19919"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"2687","bibliographicPageStart":"2679","bibliographicVolumeNumber":"63","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Industrial Electronics"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"DC-link capacitors in power electronic converters are a major constraint on improvement of power density as well as reliability. Evaluation of the dc-link capacitors in terms of power loss, ageing, and failure rate will play an important role in design stages of the next-generation power converters. This paper proposes a new evaluation circuit for dc-link capacitors used in a high-power three-phase inverter, which is intended for testing power loss, failure rate, ageing, and so on. The evaluation circuit produces a practical ripple current waveform and a dc bias voltage into a capacitor under test, in which the ripple current is equivalent to that generated by the three-phase inverter on the dc link. The evaluation circuit employs a full-scale current-rating and downscaled voltage-rating inverter for producing the ripple current, so that the power rating of the evaluation circuit is much smaller than that of a full-scale current-rating and full-scale voltage-rating inverter. Theoretical analysis and simulated results verify the effectiveness of new evaluation circuit","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TIE.2015.2511097","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ieeexplore.ieee.org/document/7362196/","subitem_relation_type_select":"URI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"IEEE "},{"subitem_rights":"© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0278-0046 ","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1557-9948","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6106"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Hasegawa, Kazunori","creatorNameLang":"en"},{"creatorName":"長谷川, 一徳","creatorNameLang":"ja"},{"creatorName":"ハセガワ, カズノリ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Nishizawa,  Shin-ichi"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-27"}],"displaytype":"detail","filename":"nperc76.pdf","filesize":[{"value":"685.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc76.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4953/files/nperc76.pdf"},"version_id":"e6197754-c02b-407b-bf9e-49689e534edb"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-27"},"publish_date":"2017-04-27","publish_status":"0","recid":"4953","relation_version_is_last":true,"title":["Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:13.441148+00:00"}