{"created":"2023-05-15T11:58:47.335720+00:00","id":4954,"links":{},"metadata":{"_buckets":{"deposit":"272e8060-bea6-4d24-8c1d-ee1ace138329"},"_deposit":{"created_by":3,"id":"4954","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4954"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00004954","sets":["8:24"]},"author_link":["28366","19921","16176"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-02-18","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"EC-1391","bibliographic_titles":[{"bibliographic_title":"2016 IEEE Energy Conversion Congress and Exposition (ECCE)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Stray inductance inside power device package will be a constraint on improvement of power density as well as switching frequency in power converters because the converters will suffer from electromagnetic interference (EMI)-related problems. This paper proposes a measurement method of mutual inductance for power device packages using time domain reflectometry. The method is characterized by introducing four-terminal measurement that distinguishes self and mutual inductances among collector, emitter, and gate terminals. A measurement fixture for a discrete IGBT is designed, constructed, and tested to ensure repeatability of the proposed method. Experimental results verifies the viability of the proposed method.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"2016 IEEE Energy Conversion Congress and Exposition (ECCE), 18-22 September 2016, Milwaukee, WI, USA","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ECCE.2016.7855285 ","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ieeexplore.ieee.org/document/7855285/","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-5090-0737-0 ","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-5090-0738-7","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"IEEE"},{"subitem_rights":"© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Biological Functions Engineering Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical and Electronic Engineering　Tokyo Metropolitan University"},{"subitem_text_value":"Department of Electrical and Electronic Engineering Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6108"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Hasegawa, Kazunori","creatorNameLang":"en"},{"creatorName":"長谷川, 一徳","creatorNameLang":"ja"},{"creatorName":"ハセガワ, カズノリ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Wada,  Keiji"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-04-27"}],"displaytype":"detail","filename":"nperc74.pdf","filesize":[{"value":"1.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc74.pdf","url":"https://kyutech.repo.nii.ac.jp/record/4954/files/nperc74.pdf"},"version_id":"eb072392-b631-4069-8344-3538f34f997f"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Time domain reflectometry","subitem_subject_scheme":"Other"},{"subitem_subject":"stray inductance","subitem_subject_scheme":"Other"},{"subitem_subject":"power device package","subitem_subject_scheme":"Other"},{"subitem_subject":"IGBT","subitem_subject_scheme":"Other"},{"subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Mutual Inductance Measurement for Power Device Package Using Time Domain Reflectometry","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Mutual Inductance Measurement for Power Device Package Using Time Domain Reflectometry"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-27"},"publish_date":"2017-04-27","publish_status":"0","recid":"4954","relation_version_is_last":true,"title":["Mutual Inductance Measurement for Power Device Package Using Time Domain Reflectometry"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:14.792449+00:00"}