{"created":"2023-05-15T11:58:50.356156+00:00","id":5020,"links":{},"metadata":{"_buckets":{"deposit":"c8207bbb-b19e-40a3-9d3a-73ffcc2787dd"},"_deposit":{"created_by":3,"id":"5020","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5020"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005020","sets":["8:24"]},"author_link":["20112","20111","1147"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-08-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"130","bibliographicPageStart":"117","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"IPSJ Transactions on System LSI Design Methodology"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Delay testing is one of key processes in production test to ensure high quality and high reliability for logic circuits. Test escape missing defective chips can be reduced by introducing delay testing. On the other hand, we need to concern yield loss caused by delay testing, i.e., over-testing. Many methods and techniques have been developed to solve problems on delay testing. In this paper, we introduce fundamental techniques of delay testing and survey recent problems and solutions. Especially we focus on techniques to enhance test quality, to avoid over-testing, and to make test design efficient by treating circuits described at register transfer level. ","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"一般社団法人情報処理学会"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.2197/ipsjtsldm.4.117","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://doi.org/10.2197/ipsjtsldm.4.117"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.2197/ipsjtsldm.4.117","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2011 by the Information Processing Society of Japan"},{"subitem_rights":"ここに掲載した著作物の利用に関する注意 本著作物の著作権は情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。 Notice for the use of this material The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan. "}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-6687","subitem_source_identifier_type":"ISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10227023"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology/JST, CREST"},{"subitem_text_value":"Nara Institute of Science and Technology/JST, CREST"},{"subitem_text_value":"Nara Institute of Science and Technology/JST, CREST"},{"subitem_text_value":"                                         "}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"4321"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Ohtake,  Satoshi"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoneda,  Tomokazu"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-06"}],"displaytype":"detail","filename":"Ipsj4_117_130.pdf","filesize":[{"value":"422.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Ipsj4_117_130.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5020/files/Ipsj4_117_130.pdf"},"version_id":"178c52af-15ba-430b-88dc-2f06c1bc1a89"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Delay Testing: Improving Test Quality and Avoiding Over-testing　","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Delay Testing: Improving Test Quality and Avoiding Over-testing　"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-06-06"},"publish_date":"2017-06-06","publish_status":"0","recid":"5020","relation_version_is_last":true,"title":["Delay Testing: Improving Test Quality and Avoiding Over-testing　"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:52:00.975802+00:00"}