{"created":"2023-05-15T11:58:51.510387+00:00","id":5044,"links":{},"metadata":{"_buckets":{"deposit":"58c0d1a2-e2b6-4df3-851e-32b54c139d36"},"_deposit":{"created_by":3,"id":"5044","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5044"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005044","sets":["15:20"]},"author_link":["20230","20231","6567","1147"],"control_number":"5044","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-12-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"277","bibliographicPageStart":"272","bibliographic_titles":[{"bibliographic_title":"2012 IEEE 21st Asian Test Symposium","bibliographic_titleLang":"en"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High test power in logic BIST is a serious problem not only for production test, but also for board test, system debug or field test. Many low power BIST approaches that focus on scan-shift power or capture power have been proposed. However, it is known that a half of scan-shift power is compensated by test responses, which is difficult to control in those approaches. This paper proposes a novel approach that directly reduces scan-out power by modifying some flip-flops' values in scan chains at the last capture. Experimental results show that the proposed method reduces scan-out power up to 30% with little loss of test coverage.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2012 IEEE 21st Asian Test Symposium, 19-22 Nov. 2012, Niigata, Japan","subitem_description_type":"Other"}]},"item_23_link_61":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS.2012.50","subitem_relation_type_select":"DOI"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"1081-7735","subitem_source_identifier_type":"PISSN"}]},"item_23_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10282570"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6198"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Wang, Senling","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sato, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-11"}],"displaytype":"detail","filename":"ats_272_277.pdf","filesize":[{"value":"677.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ats_272_277.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5044/files/ats_272_277.pdf"},"version_id":"b8eda14f-af45-4999-90cf-f3b07908a8e6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"shift power","subitem_subject_scheme":"Other"},{"subitem_subject":"low power","subitem_subject_scheme":"Other"},{"subitem_subject":"BIST","subitem_subject_scheme":"Other"},{"subitem_subject":"multi-cycle test","subitem_subject_scheme":"Other"},{"subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"A Scan-Out Power Reduction Method for Multi-Cycle BIST","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Scan-Out Power Reduction Method for Multi-Cycle BIST","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-07-11"},"publish_date":"2017-07-11","publish_status":"0","recid":"5044","relation_version_is_last":true,"title":["A Scan-Out Power Reduction Method for Multi-Cycle BIST"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-21T05:41:03.241294+00:00"}