{"created":"2023-05-15T11:58:51.552762+00:00","id":5045,"links":{},"metadata":{"_buckets":{"deposit":"6fdfa14c-0ec0-45b2-992b-3363395f25de"},"_deposit":{"created_by":3,"id":"5045","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5045"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005045","sets":["15:20"]},"author_link":["20234","20235","20236","6567","1147"],"control_number":"5045","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-12-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"178","bibliographicPageStart":"173","bibliographic_titles":[{"bibliographic_title":"2012 IEEE 21st Asian Test Symposium","bibliographic_titleLang":"en"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophisticated methods are proposed for scan-test, there are not so many for logic BIST because of its uncontrollable randomness. However, logic BIST currently becomes vital for system debug or field test. This paper proposes a novel low power BIST technology that reduces shift-power by eliminating the specified high-frequency parts of vectors and also reduces capture power. The authors show that the proposed technology not only reduces test power but also keeps test coverage with little loss.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2012 IEEE 21st Asian Test Symposium, 19-22 Nov. 2012, Niigata, Japan","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_link_61":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS.2012.27","subitem_relation_type_select":"DOI"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"1081-7735","subitem_source_identifier_type":"PISSN"}]},"item_23_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10296247"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6195"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sato, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang, Senling","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kato, Takaaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-11"}],"displaytype":"detail","filename":"ats_173_178.pdf","filesize":[{"value":"550.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ats_173_178.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5045/files/ats_173_178.pdf"},"version_id":"e477c305-1547-46b8-824a-3ab19cb54100"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"capture power","subitem_subject_scheme":"Other"},{"subitem_subject":"low power","subitem_subject_scheme":"Other"},{"subitem_subject":"BIST","subitem_subject_scheme":"Other"},{"subitem_subject":"shift-power","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Low Power BIST for Scan-Shift and Capture Power","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Low Power BIST for Scan-Shift and Capture Power","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-07-11"},"publish_date":"2017-07-11","publish_status":"0","recid":"5045","relation_version_is_last":true,"title":["Low Power BIST for Scan-Shift and Capture Power"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-16T01:12:18.880668+00:00"}