{"created":"2023-05-15T11:58:51.594966+00:00","id":5046,"links":{},"metadata":{"_buckets":{"deposit":"57bae358-bfc3-4f77-81eb-d9040cf485d3"},"_deposit":{"created_by":3,"id":"5046","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5046"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005046","sets":["15:20"]},"author_link":["20239","20240","20241","1147","1143"],"control_number":"5046","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-12-26","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"208","bibliographicPageStart":"203","bibliographic_titles":[{"bibliographic_title":"2016 IEEE 25th Asian Test Symposium (ATS)","bibliographic_titleLang":"en"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High power dissipation during scan-based logic BIST is a crucial problem that leads to over-testing. Although controlling test power of a circuit under test (CUT) to an appropriate level is strongly required, it is not easy to control test power in BIST. This paper proposes a novel power controlling method to control the toggle rate of the patterns to an arbitrary level by modifying pseudo random patterns generated by a TPG (Test Pattern Generator) of logic BIST. While many approaches have been proposed to control the toggle rate of the patterns, the proposed approach can provide higher fault coverage. Experimental results show that the proposed approach can control toggle rates to a predetermined target level and modified patterns can achieve high fault coverage without increasing test time.","subitem_description_language":"ja","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2016 IEEE 25th Asian Test Symposium (ATS), 21-24 Nov. 2016, Hiroshima, Japan","subitem_description_type":"Other"}]},"item_23_link_61":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS.2016.59","subitem_relation_type_select":"DOI"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"EISSN"}]},"item_23_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10303996"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6197"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kato, Takaaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wang, Senling","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sato, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-11"}],"displaytype":"detail","filename":"ats_203_208.pdf","filesize":[{"value":"353.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ats_203_208.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5046/files/ats_203_208.pdf"},"version_id":"84b834be-4178-4f9c-812a-636ed86c2410"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"scan shift power control","subitem_subject_scheme":"Other"},{"subitem_subject":"logic BIST","subitem_subject_scheme":"Other"},{"subitem_subject":"low power test","subitem_subject_scheme":"Other"},{"subitem_subject":"scan design","subitem_subject_scheme":"Other"},{"subitem_subject":"pseudo random pattern","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-07-11"},"publish_date":"2017-07-11","publish_status":"0","recid":"5046","relation_version_is_last":true,"title":["A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-21T05:30:42.589166+00:00"}