{"created":"2023-05-15T11:58:51.678821+00:00","id":5048,"links":{},"metadata":{"_buckets":{"deposit":"a4940b40-077f-45df-8277-83e6978ad5b3"},"_deposit":{"created_by":3,"id":"5048","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5048"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005048","sets":["8:24"]},"author_link":["20249","20251","1147","20248"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"3295","bibliographicPageStart":"3282","bibliographicVolumeNumber":"24","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on VLSI Systems"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Measuring temperature and voltage (T&V) in a current VLSI is very important in guaranteeing its reliability, because a large variation of temperature or voltage in field will reduce a delay margin and makes the chip behavior unreliable. This paper proposes a novel method of T&V measurement, which can be used for variety of applications, such as field test, online test, or hot-spot monitoring. The method counts frequencies of more than one ring oscillator (RO), which composes an aging-tolerant monitor. Then, the T&V are derived from the frequencies using a multiple regression analysis. To improve the accuracy of measurement, three techniques of an optimal selection of RO types, their calibration, and hierarchical calculation are newly introduced. In order to make sure the proposed method, circuit simulation in 180-, 90-, and 45-nm CMOS technologies is performed. In the 180-nm CMOS technology, the temperature accuracy is within 0.99 °C, and the voltage accuracy is within 4.17 mV. Furthermore, some experimental results using fabricated test chips with 180-nm CMOS technology confirm its feasibility.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/TVLSI.2016.2540654","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI: 10.1109/TVLSI.2016.2540654"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI: 10.1109/TVLSI.2016.2540654","subitem_relation_type_select":"URI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. "}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1063-8210","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1557-9999","subitem_source_identifier_type":"ISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10303999"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Tokyo Metropolitan University"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6192"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Miyake,  Yousuke"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sato,  Yasuo"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Miura,  Yukiya"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-11"}],"displaytype":"detail","filename":"tvlsis_24_11_3282.pdf","filesize":[{"value":"2.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"tvlsis_24_11_3282.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5048/files/tvlsis_24_11_3282.pdf"},"version_id":"86241c90-fc17-43db-932d-f2065d04df0a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Temperature monitor","subitem_subject_scheme":"Other"},{"subitem_subject":"voltage monitor","subitem_subject_scheme":"Other"},{"subitem_subject":"ring oscillator","subitem_subject_scheme":"Other"},{"subitem_subject":"field test","subitem_subject_scheme":"Other"},{"subitem_subject":"delay test","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Temperature and voltage measurement for field test using an Aging-Tolerant monitor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Temperature and voltage measurement for field test using an Aging-Tolerant monitor"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-07-11"},"publish_date":"2017-07-11","publish_status":"0","recid":"5048","relation_version_is_last":true,"title":["Temperature and voltage measurement for field test using an Aging-Tolerant monitor"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:51:59.582018+00:00"}