@inproceedings{oai:kyutech.repo.nii.ac.jp:00005049,
 author = {Sato,  Yasuo and Monden,  Masafumi and Miyake,  Yousuke and Kajihara, Seiji and 梶原, 誠司},
 book = {2014 IEEE 20th Pacific Rim International Symposium on Dependable Computing},
 month = {Dec},
 note = {Ring Oscillators are used for variety of purposes to enhance reliability on LSIs or FPGAs. This paper introduces an aging-tolerant design structure of ring oscillators that are used in FPGAs. The structure is able to reduce NBTI-induced degradation in a ring oscillator's frequency by setting PMOS transistors of look-up tables in an off-state when the oscillator is not working. The evaluation of a variety of ring oscillators using Altera Cyclone IV device (60nm technology) shows that the proposed structure is capable of controlling degradation level as well as reducing more than 37% performance degradation compared to the conventional oscillators., 20th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2014), Nov 19-21, 2014, Singapore},
 pages = {59--67},
 publisher = {IEEE},
 title = {Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA},
 year = {2014},
 yomi = {カジハラ, セイジ}
}