{"created":"2023-05-15T11:58:51.775249+00:00","id":5050,"links":{},"metadata":{"_buckets":{"deposit":"551f1293-e28c-400e-8d5e-212bcecb34d3"},"_deposit":{"created_by":3,"id":"5050","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5050"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005050","sets":["8:24"]},"author_link":["16176","16333","20257"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-07-17","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9-10","bibliographicPageEnd":"2035","bibliographicPageStart":"2032","bibliographicVolumeNumber":"55","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The aim is to provide failure analysis of power devices based on real-time monitoring. The real-time monitoring provides a time-domain data related to a failure mechanism. The data includes important information about primary failure, which is often lost by conventional post-defect failure analysis. Our system monitors interfaces of component material inside the device by scanning acoustic tomography (SAT) under a power cycling test in addition to electrical and thermal condition of the device. A precursor of the failure in an early stage was indicated by the interface image much earlier than a thermal and an electrical technique. Feature identification and extraction from a series of image data by image processing efficiently pointed out the damaged site before the failure was occurred.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ESREF 2015, 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 5-9, 2015, Centre de Congrès Pierre Baudis, Toulouse, France","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2015.06.128","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2015 Elsevier Ltd."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11538014","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical Engineering/Electronics, Kyushu Institute of Technology/Next generation power electronics research center, Kyushu Institute of Technology"},{"subitem_text_value":"Electronics Research Group for Sustainability, Asian Growth Research Institute/Next generation power electronics research center, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering/Electronics, Kyushu Institute of Technology/Next generation power electronics research center, Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"5587"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Watanabe, Akihiko","creatorNameLang":"en"},{"creatorName":"渡邉, 晃彦","creatorNameLang":"ja"},{"creatorName":"ワタナベ, アキヒコ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Tsukuda,  M."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-18"}],"displaytype":"detail","filename":"nperc63.pdf","filesize":[{"value":"412.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc63.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5050/files/nperc63.pdf"},"version_id":"ddc6df16-4ea8-4476-9538-a396a8747e19"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Power devices","subitem_subject_scheme":"Other"},{"subitem_subject":"Failure analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Real-time monitoring","subitem_subject_scheme":"Other"},{"subitem_subject":"Image processing","subitem_subject_scheme":"Other"},{"subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Failure Analysis of Power Devices Based on Real-Time Monitoring","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Failure Analysis of Power Devices Based on Real-Time Monitoring"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-07-18"},"publish_date":"2017-07-18","publish_status":"0","recid":"5050","relation_version_is_last":true,"title":["Failure Analysis of Power Devices Based on Real-Time Monitoring"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:45.897940+00:00"}