@article{oai:kyutech.repo.nii.ac.jp:00005056,
 author = {Tsukuda,  Masanori and Yuki,  Daisuke and Kim, Hyungseop and 金, 亨燮 and Omura, Ichiro and 大村, 一郎},
 journal = {2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)},
 month = {Jul},
 note = {We developed a screening equipment for ceramic substrate level power module of IGBT. The equipment realizes a new screening test with current distribution. The equipment acquires magnetic field signals over bonding wires and finally classifies to normal/abnormal module automatically. We established statistics based normal/abnormal classification with image processing. It is expected to be applied for screening in a production line and analysis to prevent the failure of power modules., 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD), May 28 2017-June 1 2017, Sapporo, Japan},
 pages = {407--410},
 title = {Current Distribution Based Power Module Screening by New Normal/Abnormal Classification Method with Image Processing},
 year = {2017},
 yomi = {オオムラ, イチロウ}
}