{"created":"2023-05-15T11:58:52.052591+00:00","id":5056,"links":{},"metadata":{"_buckets":{"deposit":"6785d4c7-b84c-4503-a57b-8c76ada8f241"},"_deposit":{"created_by":14,"id":"5056","owners":[14],"pid":{"revision_id":0,"type":"depid","value":"5056"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005056","sets":["15:20"]},"author_link":["20286","20287","20288","402","16176"],"control_number":"5056","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-07-24","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"410","bibliographicPageStart":"407","bibliographic_titles":[{"bibliographic_title":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We developed a screening equipment for ceramic substrate level power module of IGBT. The equipment realizes a new screening test with current distribution. The equipment acquires magnetic field signals over bonding wires and finally classifies to normal/abnormal module automatically. We established statistics based normal/abnormal classification with image processing. It is expected to be applied for screening in a production line and analysis to prevent the failure of power modules.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD), May 28 2017-June 1 2017, Sapporo, Japan","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.23919/ISPSD.2017.7988970","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1946-0201","subitem_source_identifier_type":"EISSN"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6219"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tsukuda,  Masanori","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuki,  Daisuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{"creatorAlternative":"Tomonaga,  Hiroki"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorAlternatives":[{"creatorAlternative":"Kamiya, Tohru","creatorAlternativeLang":"en"},{"creatorAlternative":"神谷, 亨","creatorAlternativeLang":"ja"},{"creatorAlternative":"カミヤ, トオル","creatorAlternativeLang":"ja-Kana"}],"creatorNames":[{"creatorName":"Kim, Hyungseop","creatorNameLang":"en"},{"creatorName":"金, 亨燮","creatorNameLang":"ja"}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-26"}],"displaytype":"detail","filename":"nperc84.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc84.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5056/files/nperc84.pdf"},"version_id":"163d8037-f277-449f-99e4-3262c55324a0"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"current distribution","subitem_subject_scheme":"Other"},{"subitem_subject":"current crowding","subitem_subject_scheme":"Other"},{"subitem_subject":"IGBT","subitem_subject_scheme":"Other"},{"subitem_subject":"power module","subitem_subject_scheme":"Other"},{"subitem_subject":"classification method","subitem_subject_scheme":"Other"},{"subitem_subject":"image processing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Current Distribution Based Power Module Screening by New Normal/Abnormal Classification Method with Image Processing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Current Distribution Based Power Module Screening by New Normal/Abnormal Classification Method with Image Processing","subitem_title_language":"en"}]},"item_type_id":"21","owner":"14","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-07-26"},"publish_date":"2017-07-26","publish_status":"0","recid":"5056","relation_version_is_last":true,"title":["Current Distribution Based Power Module Screening by New Normal/Abnormal Classification Method with Image Processing"],"weko_creator_id":"14","weko_shared_id":-1},"updated":"2024-03-06T06:05:24.383812+00:00"}