{"created":"2023-05-15T11:58:52.136010+00:00","id":5058,"links":{},"metadata":{"_buckets":{"deposit":"b99cef2d-1ca4-4804-bc81-7156e733d691"},"_deposit":{"created_by":3,"id":"5058","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5058"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005058","sets":["15:20"]},"author_link":["20295","20296","20297","16176"],"control_number":"5058","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-07-24","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"170","bibliographicPageStart":"167","bibliographic_titles":[{"bibliographic_title":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","bibliographic_titleLang":"en"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Single-Event Burnout (SEB) is a catastrophic failure in the high voltage devices that is initiated by the passage of particles during turn-off state. Previous papers reported that SEB failure rate increases sharply when applied voltage exceeds a certain threshold voltage. On the other hand, the high voltage devices for the artificial satellite have been increasing. In space, due to increase flux of particle, it is predicted that SEB failure rate will be higher. In this paper, we proposed the failure rate calculation method for high voltage devices based on SEB cross section and flux of particles. This formula can calculate the failure rate at space level and terrestrial level depending on the applied voltage of the high voltage devices.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD), May 28 2017-June 1 2017, Sapporo, Japan","subitem_description_type":"Other"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.23919/ISPSD.2017.7988937","subitem_relation_type_select":"DOI"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1946-0201","subitem_source_identifier_type":"EISSN"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6217"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shiba, Yuji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Dashdondog, Erdenebaatar","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sudo, Masaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-07-26"}],"displaytype":"detail","filename":"nperc86.pdf","filesize":[{"value":"508.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc86.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5058/files/nperc86.pdf"},"version_id":"2bbb654a-6ac1-4fb5-ac82-7f32081f704e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Single Event Burnout","subitem_subject_scheme":"Other"},{"subitem_subject":"failure rate","subitem_subject_scheme":"Other"},{"subitem_subject":"cosmic rays","subitem_subject_scheme":"Other"},{"subitem_subject":"high voltage device","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Formulation of Single Event Burnout Failure Rate for High Voltage Devices in Satellite Electrical Power System","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Formulation of Single Event Burnout Failure Rate for High Voltage Devices in Satellite Electrical Power System","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-07-26"},"publish_date":"2017-07-26","publish_status":"0","recid":"5058","relation_version_is_last":true,"title":["Formulation of Single Event Burnout Failure Rate for High Voltage Devices in Satellite Electrical Power System"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-12-26T04:29:49.614318+00:00"}