@article{oai:kyutech.repo.nii.ac.jp:00005079,
 author = {Hasegawa,  K. and Yamamoto,  K. and Yoshida,  H. and Hamada,  K. and Tsukuda,  M. and Omura, Ichiro and 大村, 一郎},
 issue = {9-10},
 journal = {Microelectronics reliability},
 month = {Aug},
 note = {This paper proposes a new short-circuit protection method for an IGBT. The proposed method is characterized by detecting not only gate charge but also gate voltage of the IGBT. This results in a shorter protection time, compared to the previous method that detects only the gate charge. A real-time monitoring system using an FPGA, A/D converters, and a D/A converter is used for the proposed protection method. Experimental results verify that the proposed method achieves a protection time of 390 ns, which is reduced by 68% compared to the previous method., ESREF 2014, 25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES,FAILURE PHYSICS AND ANALYSIS, Sep 29–Oct 3, 2014, Technische Universität Berlin},
 pages = {1897--1900},
 title = {Short-Circuit Protection for an IGBT with Detecting the Gate Voltage and Gate Charge},
 volume = {54},
 year = {2014},
 yomi = {オオムラ, イチロウ}
}