{"created":"2023-05-15T11:58:53.040962+00:00","id":5079,"links":{},"metadata":{"_buckets":{"deposit":"d3af53e5-b6cb-4357-9501-bcb23d401bf5"},"_deposit":{"created_by":3,"id":"5079","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5079"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005079","sets":["8:24"]},"author_link":["20453","20454","20455","16176","20457","20456"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-08-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9-10","bibliographicPageEnd":"1900","bibliographicPageStart":"1897","bibliographicVolumeNumber":"54","bibliographic_titles":[{"bibliographic_title":"Microelectronics reliability"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper proposes a new short-circuit protection method for an IGBT. The proposed method is characterized by detecting not only gate charge but also gate voltage of the IGBT. This results in a shorter protection time, compared to the previous method that detects only the gate charge. A real-time monitoring system using an FPGA, A/D converters, and a D/A converter is used for the proposed protection method. Experimental results verify that the proposed method achieves a protection time of 390 ns, which is reduced by 68% compared to the previous method.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ESREF 2014, 25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES,FAILURE PHYSICS AND ANALYSIS, Sep 29–Oct 3, 2014, Technische Universität Berlin","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2014.07.083","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2014 Elsevier Ltd. All rights reserved."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11538014","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Biological Functions and Engineering, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"Department of Electrical Engineering and Electronics, Kyushu Institute of Technology"},{"subitem_text_value":"The International Centre for the Study of East Asian Development (ICSEAD)"},{"subitem_text_value":"Department of Electrical Engineering and Electronics, Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"5588"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hasegawa,  K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamamoto,  K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoshida,  H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hamada,  K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsukuda,  M."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-08-21"}],"displaytype":"detail","filename":"nperc41.pdf","filesize":[{"value":"274.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc41.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5079/files/nperc41.pdf"},"version_id":"26f3a613-d1fd-4384-b24e-bbd36e2687e4"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Insulated-Gate Bipolar Transistors (IGBTs)","subitem_subject_scheme":"Other"},{"subitem_subject":"Short-circuit protection","subitem_subject_scheme":"Other"},{"subitem_subject":"Power electronic converters","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Short-Circuit Protection for an IGBT with Detecting the Gate Voltage and Gate Charge","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Short-Circuit Protection for an IGBT with Detecting the Gate Voltage and Gate Charge"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-08-21"},"publish_date":"2017-08-21","publish_status":"0","recid":"5079","relation_version_is_last":true,"title":["Short-Circuit Protection for an IGBT with Detecting the Gate Voltage and Gate Charge"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:16.950917+00:00"}