{"created":"2023-05-15T11:58:53.124048+00:00","id":5081,"links":{},"metadata":{"_buckets":{"deposit":"78560a39-2837-4ef7-8ea0-047e20cfa8ed"},"_deposit":{"created_by":3,"id":"5081","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5081"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005081","sets":["8:24"]},"author_link":["20461","20464","20462","16176","20463","20460"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-08-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9-10","bibliographicPageEnd":"1362","bibliographicPageStart":"1357","bibliographicVolumeNumber":"55","bibliographic_titles":[{"bibliographic_title":"Microelectronics Reliability"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Current crowding of IGBT and power diode in a chip or among chips is a barrier to the realization of highly-reliable power module and power electronics system. Current crowding occurs because of the parasitic inductance, difference of chip characteristics or temperature imbalance among chips. Although current crowding among IGBT or power diode chips has been analysed on numerical simulations, no sensor with sufficiently high special resolution and fast measurement time has yet been demonstrated. Therefore, the author developed and demonstrated 16-channel flat sensitivity sensor array for IGBT current distribution measurement. The sensor array consists of tiny-scale film sensors with analog amps and shield case against noise. The array and digital calibration method will be applied for reliability analysis, designing and screening of IGBT modules.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ESREF 2015, 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 5-9, 2015, Centre de Congrès Pierre Baudis, Toulouse, France","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1016/j.microrel.2015.06.045","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2015 Elsevier Ltd."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11538014","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0026-2714","subitem_source_identifier_type":"ISSN"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology"},{"subitem_text_value":"Kyushu Institute of Technology, Asian Growth Research Institute, Kitakyushu, Japan"},{"subitem_text_value":"COPER ELECTRONICS CO."},{"subitem_text_value":"C.D.N. CORPORATION"},{"subitem_text_value":"HOH KOH SYA Co., Ltd."},{"subitem_text_value":"Kyushu Institute of Technology"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"5585"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tomonaga,  H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsukuda,  M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Okoda,  S."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Noda,  R."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tashiro,  K."}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-08-21"}],"displaytype":"detail","filename":"nperc65.pdf","filesize":[{"value":"874.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc65.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5081/files/nperc65.pdf"},"version_id":"2b8efe30-fe7e-47d7-b0b9-d80f659fa760"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"IGB","subitem_subject_scheme":"Other"},{"subitem_subject":"Current distribution","subitem_subject_scheme":"Other"},{"subitem_subject":"Current crowding","subitem_subject_scheme":"Other"},{"subitem_subject":"Film sensor","subitem_subject_scheme":"Other"},{"subitem_subject":"Reliability analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Magnetic flux","subitem_subject_scheme":"Other"},{"subitem_subject":"Digital calibration","subitem_subject_scheme":"Other"},{"subitem_subject":"Flat sensitivity","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"16-channnel Micro Magnetic Flux Sensor Array for IGBT Current Distribution Measurement","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"16-channnel Micro Magnetic Flux Sensor Array for IGBT Current Distribution Measurement"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-08-21"},"publish_date":"2017-08-21","publish_status":"0","recid":"5081","relation_version_is_last":true,"title":["16-channnel Micro Magnetic Flux Sensor Array for IGBT Current Distribution Measurement"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:48:49.690312+00:00"}