@article{oai:kyutech.repo.nii.ac.jp:00005166,
 author = {Kajihara, Seiji and 梶原, 誠司 and Morishima, Shohei and Yamamoto, Masahiro and Wen, Xiaoqing and 温, 暁青 and Fukunaga, Masayasu and Hatayama, Kazumi and Aikyo, Takashi},
 journal = {IPSJ Transactions on System LSI Design Methodology},
 month = {Aug},
 note = {As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.},
 pages = {104--115},
 title = {Estimation of Delay Test Quality and Its Application to Test Generation},
 volume = {1},
 year = {2008},
 yomi = {カジハラ, セイジ and オン, ギョウセイ}
}