{"created":"2023-05-15T11:58:56.707739+00:00","id":5166,"links":{},"metadata":{"_buckets":{"deposit":"24076671-aad1-4e18-9f76-f6ac052fb5a8"},"_deposit":{"created_by":3,"id":"5166","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5166"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005166","sets":["8:24"]},"author_link":["1147","20748","20749","1143","20751","20752","20753"],"control_number":"5166","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1010000782469395713","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-08-27","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"115","bibliographicPageStart":"104","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"IPSJ Transactions on System LSI Design Methodology","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.2197/ipsjtsldm.1.104","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2008 by the Information Processing Society of Japan. Notice for the use of this material The copyright of this material is retained by the Information Processing Society of Japan (IPSJ). This material is published on this web site with the agreement of the author (s) and the IPSJ. Please be complied with Copyright Law of Japan and the Code of Ethics of the IPSJ if any users wish to reproduce, make derivative work, distribute or make available to the public any part or whole thereof. All Rights Reserved, Copyright (C) Information Processing Society of Japan.","subitem_rights_language":"en"},{"subitem_rights":"ここに掲載した著作物の利用に関する注意 本著作物の著作権は情報処理学会に帰属します。本著作物は著作権者である情報処理学会の許可のもとに掲載するものです。ご利用に当たっては「著作権法」ならびに「情報処理学会倫理綱領」に従うことをお願いいたします。","subitem_rights_language":"ja"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-6687","subitem_source_identifier_type":"EISSN"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"620"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Morishima, Shohei","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamamoto, Masahiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Fukunaga, Masayasu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hatayama, Kazumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Aikyo, Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-09-20"}],"displaytype":"detail","filename":"1_104.pdf","filesize":[{"value":"381.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"1_104.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5166/files/1_104.pdf"},"version_id":"263ab3cb-1f2c-4a4c-9b2a-d34b91ac6ec8"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Estimation of Delay Test Quality and Its Application to Test Generation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Estimation of Delay Test Quality and Its Application to Test Generation","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-09-20"},"publish_date":"2017-09-20","publish_status":"0","recid":"5166","relation_version_is_last":true,"title":["Estimation of Delay Test Quality and Its Application to Test Generation"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-06T07:23:45.520156+00:00"}