{"created":"2023-05-15T11:58:57.849421+00:00","id":5193,"links":{},"metadata":{"_buckets":{"deposit":"2ae2b7d2-60d5-4606-81fb-e01484b65b9d"},"_deposit":{"created_by":3,"id":"5193","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5193"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005193","sets":["8:24"]},"author_link":["20905","20906","20907","20908","17583","17575","17484","754"],"control_number":"5193","item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-02-08","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"8","bibliographicPageStart":"1","bibliographicVolumeNumber":"9","bibliographic_titles":[{"bibliographic_title":"Transactions of the Japan Society for Aeronautical and Space Sciences, Aerospace Technology Japan","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Spacecraft surface charging can lead to arcing and a loss of electricity generation capability in solar panels or even loss of a satellite. The charging problem may be further aggravated by atomic oxygen (AO) exposure in Low Earth orbits, which modifies the surface of materials like polyimide, Teflon, anti-reflective coatings, cover glass etc, used on satellite surfaces, affecting materials properties, such as resistivity, secondary electron emissivity and photo emission, which govern the charging behavior. These properties are crucial input parameters for spacecraft charging analysis. To study the AO exposure effect on charging governing properties, an atomic oxygen exposure facility based on laser detonation of oxygen was built. The facility produces AO with a peak velocity value around 10-12km/s and a higher flux than that existing in orbit. After exposing the polyimide test material to the equivalent of 10 years of AO fluence at an altitude of 700-800 km, surface charging properties like surface resistivity and volume resistivity were measured. The measurement was performed in a vacuum using the charge storage decay method at room temperature, which is considered the most appropriate for measuring resistivity for space applications. The results show that the surface resistivity increases and the volume resistivity remains almost the same for the AO exposure fluence of 5.4×1018 atoms cm-2.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_text":"https://hyokadb02.jimu.kyutech.ac.jp/html/168_ja.html","subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/168_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"日本航空宇宙学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.2322/tastj.9.1","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2011 The Japan Society for Aeronautical and Space Sciences"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1884-0485","subitem_source_identifier_type":"EISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10017558"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"518"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Mundari, Noor Danish Ahrar","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"20905","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Khan, Arifur Rahman","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"20906","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Chiga, Masaru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"20907","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okumura, Teppei","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"20908","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"増井, 博一","creatorNameLang":"ja"},{"creatorName":"Masui, 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Kazuhiro","creatorNameLang":"en"},{"creatorName":"豊田, 和弘","creatorNameLang":"ja"},{"creatorName":"トヨダ, カズヒロ","creatorNameLang":"ja-Kana"}],"familyNames":[{"familyName":"Toyoda","familyNameLang":"en"},{"familyName":"豊田","familyNameLang":"ja"},{"familyName":"トヨダ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Kazuhiro","givenNameLang":"en"},{"givenName":"和弘","givenNameLang":"ja"},{"givenName":"カズヒロ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"17484","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10361411","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000010361411"},{"nameIdentifier":"35281385500","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=35281385500"},{"nameIdentifier":"72","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/72_ja.html"}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"趙, 孟佑","creatorNameLang":"ja"},{"creatorName":"Cho, Mengu","creatorNameLang":"en"}],"familyNames":[{"familyName":"趙","familyNameLang":"ja"},{"familyName":"Cho","familyNameLang":"en"}],"givenNames":[{"givenName":"孟佑","givenNameLang":"ja"},{"givenName":"Mengu","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"754","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"60243333","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/nrid/1000060243333"},{"nameIdentifier":"7401727758","nameIdentifierScheme":"Scopus著者ID","nameIdentifierURI":"https://www.scopus.com/authid/detail.uri?authorId=7401727758"},{"nameIdentifier":"168","nameIdentifierScheme":"九工大研究者情報","nameIdentifierURI":"https://hyokadb02.jimu.kyutech.ac.jp/html/168_ja.html"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-12"}],"displaytype":"detail","filename":"LaSEINE-2010_07.pdf","filesize":[{"value":"828.6 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Exposure on Surface Resistivity Change of Spacecraft Insulator Material","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Effect of Atomic Oxygen Exposure on Surface Resistivity Change of Spacecraft Insulator Material","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-10-12"},"publish_date":"2017-10-12","publish_status":"0","recid":"5193","relation_version_is_last":true,"title":["Effect of Atomic Oxygen Exposure on Surface Resistivity Change of Spacecraft Insulator Material"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2025-07-17T06:35:35.697494+00:00"}