{"created":"2023-05-15T11:59:01.740570+00:00","id":5285,"links":{},"metadata":{"_buckets":{"deposit":"25f54e0e-1c74-4883-893f-f8b669d4bdab"},"_deposit":{"created_by":3,"id":"5285","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5285"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005285","sets":["15:20"]},"author_link":["28366","21284","21280","16176","21156"],"item_27_alternative_title_18":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Front-Loading of EMI Test: A New Noise Measurement System"}]},"item_27_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-11-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"62","bibliographicPageStart":"59","bibliographicVolumeNumber":"2017","bibliographic_titles":[{"bibliographic_title":"電気学会研究会資料. EDD, 電子デバイス研究会"}]}]},"item_27_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The accurate measurement of EMI is essential because radiated noise from power electronics cause the malfunction of a peripheral device or itself. This paper develops a new EMI measurement system for power electronics equipment with double pulse test. The system is capable of confirming EMI level of power electronics equipment in an early stage of development. In addition, the system identifies the noise sources in the surface of the power electronics by scanning the near magnetic field. The system contributes to reducing the development period and cost of the power electronics equipment.","subitem_description_type":"Abstract"}]},"item_27_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"電気学会電子デバイス/半導体電力変換合同研究会（IEE-SPC）パワーデバイス・パワーエレクトロニクスとその実装技術, 2017年11月20日-21日, 鹿児島大学 稲盛会館, 鹿児島県","subitem_description_type":"Other"}]},"item_27_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_27_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"21284","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Iwasaki,  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一郎","nameLang":"ja"},{"name":"オオムラ, イチロウ","nameLang":"ja-Kana"}]}]},"item_27_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"一般社団法人電気学会"}]},"item_27_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"一般社団法人電気学会"}]},"item_27_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_27_text_37":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"}]},"item_27_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6601"}]},"item_27_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"岩﨑,  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test","subitem_subject_scheme":"Other"},{"subitem_subject":"Noise measurement system","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"ダブルパルス試験によるパワーエレクトロニクス機器用ノイズ計測システムの構築","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ダブルパルス試験によるパワーエレクトロニクス機器用ノイズ計測システムの構築"}]},"item_type_id":"27","owner":"3","path":["20"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-01-10"},"publish_date":"2018-01-10","publish_status":"0","recid":"5285","relation_version_is_last":true,"title":["ダブルパルス試験によるパワーエレクトロニクス機器用ノイズ計測システムの構築"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T10:49:12.891250+00:00"}