{"created":"2023-05-15T11:59:01.782701+00:00","id":5286,"links":{},"metadata":{"_buckets":{"deposit":"e3d5955a-3aea-4b22-8556-0d773375b113"},"_deposit":{"created_by":14,"id":"5286","owners":[14],"pid":{"revision_id":0,"type":"depid","value":"5286"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005286","sets":["15:20"]},"author_link":["21288","21289","21290","402","16176"],"control_number":"5286","item_1694584486188":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1050011097164683392","subitem_relation_type_select":"URI"}}]},"item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-11-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"58","bibliographicPageStart":"53","bibliographicVolumeNumber":"2017","bibliographic_titles":[{"bibliographic_title":"電気学会研究会資料. EDD, 電子デバイス研究会","bibliographic_titleLang":"ja"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We developed a screening equipment for ceramic substrate level power module of IGBT. The equipment acquires current signals and finally classifies to normal/abnormal module. We established statistics based classification with image processing. It is expected to be applied for screening in a production line and failure analysis of power modules.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"電気学会電子デバイス/半導体電力変換合同研究会（IEE-SPC）パワーデバイス・パワーエレクトロニクスとその実装技術, 2017年11月20日-21日, 鹿児島大学 稲盛会館, 鹿児島県","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_23_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"電気学会","subitem_publisher_language":"ja"}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"一般社団法人電気学会"}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"6603"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"附田,  正則","creatorNameLang":"ja"},{"creatorName":"Tsukuda,  Masanori","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"結城,  大介","creatorNameLang":"ja"},{"creatorName":"Yuki,  Daisuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{}],"creatorNames":[{"creatorName":"Tomonaga,  Hiroki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorAlternatives":[{},{},{}],"creatorNames":[{"creatorName":"Kim, Hyungseop","creatorNameLang":"en"},{"creatorName":"金, 亨燮","creatorNameLang":"ja"}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Omura, Ichiro","creatorNameLang":"en"},{"creatorName":"大村, 一郎","creatorNameLang":"ja"},{"creatorName":"オオムラ, イチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-01-10"}],"displaytype":"detail","filename":"nperc99.pdf","filesize":[{"value":"1.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"nperc99.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5286/files/nperc99.pdf"},"version_id":"7c61e96d-4499-4f5b-b38d-cd424852de54"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"パワーモジュール","subitem_subject_scheme":"Other"},{"subitem_subject":"スクリーニング","subitem_subject_scheme":"Other"},{"subitem_subject":"電流分布","subitem_subject_scheme":"Other"},{"subitem_subject":"画像処理","subitem_subject_scheme":"Other"},{"subitem_subject":"不良分析","subitem_subject_scheme":"Other"},{"subitem_subject":"IGBT","subitem_subject_scheme":"Other"},{"subitem_subject":"Power module","subitem_subject_scheme":"Other"},{"subitem_subject":"Screening","subitem_subject_scheme":"Other"},{"subitem_subject":"Current distribution","subitem_subject_scheme":"Other"},{"subitem_subject":"Image processing","subitem_subject_scheme":"Other"},{"subitem_subject":"Failure analysis","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"電流分布に基づくパワーモジュールの新しいスクリーニング法の提案","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電流分布に基づくパワーモジュールの新しいスクリーニング法の提案","subitem_title_language":"ja"},{"subitem_title":"Proposal of New Screening Method of Power Modules based on Current Distribution","subitem_title_language":"en"}]},"item_type_id":"23","owner":"14","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2018-01-10"},"publish_date":"2018-01-10","publish_status":"0","recid":"5286","relation_version_is_last":true,"title":["電流分布に基づくパワーモジュールの新しいスクリーニング法の提案"],"weko_creator_id":"14","weko_shared_id":-1},"updated":"2023-10-31T01:49:49.403953+00:00"}