@article{oai:kyutech.repo.nii.ac.jp:00005555,
 author = {Matsushita, Teruo and 松下, 照男 and 小田部, エドモンド 荘司 and Otabe, Edmund Soji and Kim, Dongho and Hwang, Taejong and Gao, Huixian and Liu, Fang and Liu, Huajun and Cooley, Lance and Turrioni, Daniele. and Raine, Mark J. and Hampshire, Damian P.},
 issue = {2},
 journal = {IEEE Transactions on Applied Superconductivity},
 month = {Dec},
 note = {In this paper, a round robin test of residual resistance ratio (RRR) is performed for Nb3Sn composite superconductors prepared by an internal tin method by six institutes with the international standard test method described in IEC 61788-4. It was found that uncertainty mainly resulted from determination of the cryogenic resistance from the intersection of two straight lines drawn to fit the voltage versus temperature curve around the resistive transition. The measurement clarified that RRR can be measured with expanded uncertainty not larger than 5% with the coverage factor 2 by using this test method.},
 title = {Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors},
 volume = {28},
 year = {2017},
 yomi = {マツシタ, テルオ and オタベ, エドモンド ソウジ}
}