{"created":"2023-05-15T11:59:13.632453+00:00","id":5555,"links":{},"metadata":{"_buckets":{"deposit":"de1b95a4-cda0-407e-8b25-c5452fe5d504"},"_deposit":{"created_by":3,"id":"5555","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5555"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005555","sets":["8:24"]},"author_link":["633","572","22503","22504","22505","22506","22507","22508","22509","22510","22511"],"control_number":"5555","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1050282813888679168","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-12-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicVolumeNumber":"28","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Applied Superconductivity","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this paper, a round robin test of residual resistance ratio (RRR) is performed for Nb3Sn composite superconductors prepared by an internal tin method by six institutes with the international standard test method described in IEC 61788-4. It was found that uncertainty mainly resulted from determination of the cryogenic resistance from the intersection of two straight lines drawn to fit the voltage versus temperature curve around the resistive transition. The measurement clarified that RRR can be measured with expanded uncertainty not larger than 5% with the coverage factor 2 by using this test method.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/205_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/TASC.2017.2781182","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c)  2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA10791666","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1558-2515","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"PISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10316511"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"7030"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Matsushita, Teruo","creatorNameLang":"en"},{"creatorName":"松下, 照男","creatorNameLang":"ja"},{"creatorName":"マツシタ, テルオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"小田部, エドモンド 荘司","creatorNameLang":"ja"},{"creatorName":"オタベ, エドモンド ソウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Otabe, Edmund Soji","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{},{}]},{"creatorNames":[{"creatorName":"Kim, Dongho","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hwang, Taejong","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Gao, Huixian","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Liu, Fang","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Liu, Huajun","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Cooley, Lance","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Turrioni, Daniele.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Raine, Mark J.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hampshire, Damian P.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-05-25"}],"displaytype":"detail","filename":"10316511.pdf","filesize":[{"value":"646.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10316511.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5555/files/10316511.pdf"},"version_id":"a71b0e82-12ea-47d9-9993-53943034455c"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Nb3Sn composite wire","subitem_subject_scheme":"Other"},{"subitem_subject":"Copper","subitem_subject_scheme":"Other"},{"subitem_subject":"residual resistance ratio","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2018-05-25"},"publish_date":"2018-05-25","publish_status":"0","recid":"5555","relation_version_is_last":true,"title":["Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-12-26T04:35:51.621081+00:00"}