{"created":"2023-05-15T11:59:23.670225+00:00","id":5786,"links":{},"metadata":{"_buckets":{"deposit":"05b9e96c-6755-4e7f-80c3-d98d93541519"},"_deposit":{"created_by":3,"id":"5786","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5786"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00005786","sets":["8:24"]},"author_link":["23564","17316"],"control_number":"5786","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1390282679582564480","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-04-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"606","bibliographicPageStart":"600","bibliographicVolumeNumber":"128","bibliographic_titles":[{"bibliographic_title":"電気学会論文誌. C, 電子・情報・システム部門誌","bibliographic_titleLang":"ja"},{"bibliographic_title":"The transactions of the Institute of Electrical Engineers of Japan. C, A publication of Electronics, Information and Systems Society","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The contours of many industrial parts contain straight lines and positions of the lines are therefore useful information for object detection. This paper presents a matching technique of straight lines in θ-ρ space. Any lines in 2D space are represented with parameters θ and ρ by Hough transform. To find an object is to find combination of line parameters in θ-ρ space. Our matching method contains edge detection, line detection and matching processes. At first, we perform edge detection for model and scene image to detect contour of objects. Next, we extract the straight lines using Hough transform for provided edge image. Then in the matching process, we perform matching with parameters of straight lines. Matching process contains θ matching, ρ matching and pose estimation. In the θ matching, we use the relative θ values of corresponding lines. In the ρ matching, we compute parameters of transfer and deviations of ρ values. Finally, in the pose estimation we compute transfer parameters using corresponding intersection points of the straight lines. The experimental results show our method is robust for rotation, occlusion and scaling of objects.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"電気学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1541/ieejeiss.128.600","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 電気学会 2008"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AN10065950","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1348-8155","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"0385-4221","subitem_source_identifier_type":"PISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"548","subitem_subject_scheme":"NDC"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"855"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"奥苑, 大成","creatorNameLang":"ja"},{"creatorName":"Okuzono, Taisei","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Wakizako, Hitoshi","creatorNameLang":"en"},{"creatorName":"脇迫, 仁","creatorNameLang":"ja"},{"creatorName":"ワキザコ, ヒトシ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-12-07"}],"displaytype":"detail","filename":"ieejeiss.128.600.pdf","filesize":[{"value":"2.7 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ieejeiss.128.600.pdf","url":"https://kyutech.repo.nii.ac.jp/record/5786/files/ieejeiss.128.600.pdf"},"version_id":"ab561db7-50c0-4688-8601-144fce40a0a9"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"object detection","subitem_subject_scheme":"Other"},{"subitem_subject":"hough transform","subitem_subject_scheme":"Other"},{"subitem_subject":"line detection","subitem_subject_scheme":"Other"},{"subitem_subject":"image analysis","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"θ-ρパラメータによる多角形の物体検出","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"θ-ρパラメータによる多角形の物体検出","subitem_title_language":"ja"},{"subitem_title":"Object Detection Using Straight Line Matching in θ-ρ Space","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2018-12-07"},"publish_date":"2018-12-07","publish_status":"0","recid":"5786","relation_version_is_last":true,"title":["θ-ρパラメータによる多角形の物体検出"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-20T02:52:29.762418+00:00"}