WEKO3
アイテム
LEO Single Event Upset Emulator for Validation of FPGA Based Avionics Systems
http://hdl.handle.net/10228/00007247
http://hdl.handle.net/10228/000072474d4a9945-69bb-4864-afac-c54e1bb2101d
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
LaSEINE-2014_03.pdf (945.8 kB)
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||||||
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| 公開日 | 2019-06-26 | |||||||||
| 資源タイプ | ||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||
| 資源タイプ | conference paper | |||||||||
| タイトル | ||||||||||
| タイトル | LEO Single Event Upset Emulator for Validation of FPGA Based Avionics Systems | |||||||||
| 言語 | en | |||||||||
| 言語 | ||||||||||
| 言語 | eng | |||||||||
| 著者 |
Ibrahim, Mohamed Mahmoud
× Ibrahim, Mohamed Mahmoud× 浅海, 賢一
WEKO
24725
× 趙, 孟佑 |
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| 抄録 | ||||||||||
| 内容記述タイプ | Abstract | |||||||||
| 内容記述 | This paper presents a complete design and implementation of a Single Event Upset (SEU) emulation system that can be used to inject faults Static Random Access Memory (SRAM) based Field Programmable Gate Array (FPGA). The FPGA is used to implement an avionics system for a small satellite. The fault injector emulates the expected Single Event Upset (SEU) rate as it would be in the Low Earth Orbit (LEO) of the polar orbiting satellites at inclinations close to 98° deg., and altitude of about 670 km. The emulator injects faults in the configuration bit-stream of the FPGA without stopping its operation. It makes use of the partial reconfiguration feature of today's FPGAs. This provides a facility to assess the design performance in space even if radiation testing will not be conducted before launching. Also, it simulates the expected upset rate and hence calculates the corresponding data failure rates for Triple Modular Redundancy (TMR) fault tolerant designs. The system was implemented using the Xilinx Virtex- LX50T FPGA. The FPGA suffered system failures during the fault injection test. It recovered about 50% of the failures. TMR simulation at an upset rate of 0.1 upsets (per bit per second) for a data size of 2048 bits showed that about 33% of the faults will be fully corrected. | |||||||||
| 備考 | ||||||||||
| 内容記述タイプ | Other | |||||||||
| 内容記述 | 29th International Symposium on Space Technology and Science (ISTS), June 2 to June 9, 2013, Nagoya City, Aichi | |||||||||
| 書誌情報 |
Transactions of the Japan Society for Aeronautical and Space Sciences, Aerospace Technology Japan 巻 12, 号 ists29, p. Tf_19-Tf_25, 発行日 2014-06-04 |
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| 出版社 | ||||||||||
| 出版社 | 日本航空宇宙学会 | |||||||||
| DOI | ||||||||||
| 関連タイプ | isIdenticalTo | |||||||||
| 識別子タイプ | DOI | |||||||||
| 関連識別子 | https://doi.org/10.2322/tastj.12.Tf_19 | |||||||||
| NAID | ||||||||||
| 関連タイプ | isIdenticalTo | |||||||||
| 識別子タイプ | NAID | |||||||||
| 関連識別子 | 130004956791 | |||||||||
| ISSN | ||||||||||
| 収録物識別子タイプ | PISSN | |||||||||
| 収録物識別子 | 1884-0485 | |||||||||
| 著作権関連情報 | ||||||||||
| 権利情報 | Copyright (c) 2014 by the Japan Society for Aeronautical and Space Sciences and ISTS. | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | FPGA | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | SEU | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | Avionics Systems | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | TMR | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | Fault Tolerance | |||||||||
| 出版タイプ | ||||||||||
| 出版タイプ | VoR | |||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||
| 査読の有無 | ||||||||||
| 値 | yes | |||||||||
| 連携ID | ||||||||||
| 値 | 7698 | |||||||||
