{"created":"2023-05-15T11:59:40.636925+00:00","id":6217,"links":{},"metadata":{"_buckets":{"deposit":"bae0217f-cc5f-4d2f-9463-4b1a14ea3703"},"_deposit":{"created_by":3,"id":"6217","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6217"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006217","sets":["8:24"]},"author_link":["25589","25588","17484","754"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-10-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicPageEnd":"152101-3","bibliographicPageStart":"152101-1","bibliographicVolumeNumber":"99","bibliographic_titles":[{"bibliographic_title":"Applied Physics Letters"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Due to the injection of primary electrons and the emission of secondary electrons in the surface layer of insulating materials, the target surface will be negatively or positively charged. A method by injecting a single pulse beam and using a small current detector for the total electron emission yield measurement of insulating material is proposed, which can avoid the influence from charged surface. Using the developed system, the total electron emission yield of 25 μm thick polyimide film has been studied, as induced by a single 50 μs pulse of primary electrons with energy up to 2500 eV.","subitem_description_type":"Abstract"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Journal Article","subitem_description_type":"Other"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.3647637","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2011 American Institute of Physics. The following article has been submitted to/accepted by Applied Physics Letters. After it is published, it will be found at https://aip.scitation.org/journal/apl."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00543431","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0003-6951","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1077-3118","subitem_source_identifier_type":"ISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka, 804-8550, Japan"},{"subitem_text_value":"Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka, 804-8550, Japan"},{"subitem_text_value":"Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka, 804-8550, Japan"},{"subitem_text_value":"Laboratory of Spacecraft Environment Interaction Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka, 804-8550, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"7921"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Chen,  Yu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kouno,  Takanori"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Toyoda, Kazuhiro","creatorNameLang":"en"},{"creatorName":"豊田, 和弘","creatorNameLang":"ja"},{"creatorName":"トヨダ, カズヒロ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Cho, Mengu","creatorNameLang":"en"},{"creatorName":"趙, 孟佑","creatorNameLang":"ja"},{"creatorName":"チヨウ, メンウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-11-12"}],"displaytype":"detail","filename":"LaSEINE-2011_02.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"LaSEINE-2011_02.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6217/files/LaSEINE-2011_02.pdf"},"version_id":"9e9cbb47-4469-43a8-844d-f4f202b7b179"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Total electron emission yield measurement of insulator by a scanning small detector","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Total electron emission yield measurement of insulator by a scanning small detector"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-11-12"},"publish_date":"2019-11-12","publish_status":"0","recid":"6217","relation_version_is_last":true,"title":["Total electron emission yield measurement of insulator by a scanning small detector"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:21:27.268966+00:00"}