@article{oai:kyutech.repo.nii.ac.jp:00006276,
 author = {Iwata, Minoru and 岩田, 稔 and Khan,  Arifur R. and Igawa,  Hideyuki and Toyoda, Kazuhiro and 豊田, 和弘 and Cho, Mengu and 趙, 孟佑 and Fujita,  Tatsuhito},
 issue = {3},
 journal = {Journal of Spacecraft and Rockets},
 month = {May},
 note = {Prevention of spacecraft charging and discharging has become increasingly important as geostationary Earth-orbit satellites employ higher bus voltages. There are numerous mitigation techniques against spacecraft charging, including electron emission from the spacecraft chassis. A new electron emission device operating in a completely passive manner has been developed, which uses the field enhancement at the triple junction where the interface of metal and insulator is exposed to space. It has been named electron-emitting film for spacecraft charging mitigation (ELF’S CHARM). Microetching was applied to polyimide-copper laminated film to manufacture a laboratory prototype. This prototype ELF maintains the emission current at the steady state from the triple junctions instead of leading to arcing. The electric field at the triple junction is macroscopically enhanced by charging the polyimide film and microscopically by dielectric impurities on the copper surface. The laboratory experiments confirmed a stable current emission from 10 to 100μA for 4 hr from a 5-mm square sample having a 500-μm microetching pattern. Recently, the endurance of this ELF design has been confirmed by 100 hr of accumulated emission testing.},
 pages = {546--552},
 title = {Development of Electron-emitting Film for Spacecraft Charging Mitigation},
 volume = {49},
 year = {2012},
 yomi = {イワタ, ミノル and トヨダ, カズヒロ and チヨウ, メンウ}
}