WEKO3
アイテム
Mutual inductance influence to switching speed and TDR measurements for separating self- and mutual inductances in the package
http://hdl.handle.net/10228/00007503
http://hdl.handle.net/10228/000075030dc89798-5254-4436-bf3b-b445bbe96137
| 名前 / ファイル | ライセンス | アクション |
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||||||||
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| 公開日 | 2020-01-06 | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| タイトル | ||||||||||||
| タイトル | Mutual inductance influence to switching speed and TDR measurements for separating self- and mutual inductances in the package | |||||||||||
| 言語 | en | |||||||||||
| 言語 | ||||||||||||
| 言語 | eng | |||||||||||
| 著者 |
Iida, H.
× Iida, H.× Hasegawa, K.× 大村, 一郎
WEKO
16176
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| 抄録 | ||||||||||||
| 内容記述タイプ | Abstract | |||||||||||
| 内容記述 | Parasitic inductances in power semiconductor packages affect the device switching speeds. The self-inductance of the source terminal has been considered to be the main factor that limits the switching speed, but mutual inductances among the three terminals also influence the speed. This paper proposes a method to measure the source self-inductance and the mutual inductances in the package using time-domain reflectometry (TDR) and time-domain transmissometry (TDT) that reveals the limitation of the switching speed. The measurement results agreed well with those of Q3D simulation. | |||||||||||
| 備考 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 31st IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD 2019), 19-23 May 2019, Shanghai, China | |||||||||||
| 書誌情報 |
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) 発行日 2019-07-11 |
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| 出版社 | ||||||||||||
| 出版社 | IEEE | |||||||||||
| DOI | ||||||||||||
| 関連タイプ | isVersionOf | |||||||||||
| 識別子タイプ | DOI | |||||||||||
| 関連識別子 | https://doi.org/10.1109/ISPSD.2019.8757658 | |||||||||||
| ISBN | ||||||||||||
| 識別子タイプ | ISBN | |||||||||||
| 関連識別子 | 978-1-7281-0581-9 | |||||||||||
| ISBN | ||||||||||||
| 識別子タイプ | ISBN | |||||||||||
| 関連識別子 | 978-1-7281-0580-2 | |||||||||||
| ISBN | ||||||||||||
| 識別子タイプ | ISBN | |||||||||||
| 関連識別子 | 978-1-7281-0579-6 | |||||||||||
| ISBN | ||||||||||||
| 識別子タイプ | ISBN | |||||||||||
| 関連識別子 | 978-1-7281-0582-6 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||
| 収録物識別子 | 1946-0201 | |||||||||||
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| 収録物識別子タイプ | PISSN | |||||||||||
| 収録物識別子 | 1063-6854 | |||||||||||
| 著作権関連情報 | ||||||||||||
| 権利情報 | Copyright (c) 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | mutual inductance | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | switching speed | |||||||||||
| キーワード | ||||||||||||
| 主題Scheme | Other | |||||||||||
| 主題 | power semiconductor package | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | TDR | |||||||||||
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| 主題Scheme | Other | |||||||||||
| 主題 | TDT | |||||||||||
| 出版タイプ | ||||||||||||
| 出版タイプ | AM | |||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
| 査読の有無 | ||||||||||||
| 値 | yes | |||||||||||
| 連携ID | ||||||||||||
| 値 | 8020 | |||||||||||