{"created":"2023-05-15T11:59:44.169566+00:00","id":6306,"links":{},"metadata":{"_buckets":{"deposit":"6661be3d-fa5c-4a5f-88a4-f8af50c94a36"},"_deposit":{"created_by":3,"id":"6306","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6306"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006306","sets":["15:20"]},"author_link":["26011","26010","1147"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-11-03","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2017 International Test Conference in Asia (ITC-Asia)"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The proposed digital sensor measures both temperature and voltage simultaneously in field. The sensor is ring oscillator (RO)-based and its design is fully digital. Its measurement time is shorter than the conventional analog sensors' and it can be placed at any place such as the boundary of a CPU core, GPU core, or Memory. This paper investigates the accuracy of the sensor derived from reduction of temporal and spatial variations. The variations are evaluated by the measurement of a fabricated test chip. When the measurement time is long like the analog sensors, the variations during measurement has a great influence on sensor' accuracy. The comprehensive evaluations show that the total measurement error is smaller than the analog sensors' and it implies the importance of real time and contiguous measurement.","subitem_description_type":"Abstract"}]},"item_21_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"International Test Conference in Asia (ITC-Asia 2017), September 13-15, 2017, Taipei City, Taiwan","subitem_description_type":"Other"}]},"item_21_description_60":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"Conference Paper","subitem_description_type":"Other"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"info:doi/10.1109/ITC-ASIA.2017.8097126","subitem_relation_type_select":"DOI"}}]},"item_21_relation_14":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"DOI:10.1109/ITC-ASIA.2017.8097126"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"DOI:10.1109/ITC-ASIA.2017.8097126","subitem_relation_type_select":"URI"}}]},"item_21_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-5386-3051-8","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-5386-3052-5","subitem_relation_type_select":"ISBN"}}]},"item_21_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10310516"}]},"item_21_text_36":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology, lizuka, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, lizuka, Japan"},{"subitem_text_value":"Kyushu Institute of Technology, lizuka, Japan"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8026"}]},"item_21_version_type_58":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Miyake,  Yousuke"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sato,  Yasuo"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-09"}],"displaytype":"detail","filename":"10310516.pdf","filesize":[{"value":"2.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"10310516.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6306/files/10310516.pdf"},"version_id":"441a1f59-8602-4a3f-bb2c-8a4e3b9f807e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Temperature sensor","subitem_subject_scheme":"Other"},{"subitem_subject":"Voltage sensor","subitem_subject_scheme":"Other"},{"subitem_subject":"Ring Oscillator","subitem_subject_scheme":"Other"},{"subitem_subject":"Fully digital design","subitem_subject_scheme":"Other"},{"subitem_subject":"Field test","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"On the effects of real time and contiguous measurement with a digital temperature and voltage sensor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On the effects of real time and contiguous measurement with a digital temperature and voltage sensor"}]},"item_type_id":"21","owner":"3","path":["20"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-09"},"publish_date":"2020-01-09","publish_status":"0","recid":"6306","relation_version_is_last":true,"title":["On the effects of real time and contiguous measurement with a digital temperature and voltage sensor"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-25T08:52:05.558126+00:00"}