{"created":"2023-05-15T11:59:44.211021+00:00","id":6307,"links":{},"metadata":{"_buckets":{"deposit":"d42887fe-08d8-4dd4-9653-f474e6cb85d4"},"_deposit":{"created_by":3,"id":"6307","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6307"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006307","sets":["15:20"]},"author_link":["26013","26014","26015","26016","1147"],"control_number":"6307","item_23_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-12-10","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"2018 IEEE 27th Asian Test Symposium (ATS)","bibliographic_titleLang":"en"}]}]},"item_23_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Multi-cycle test with partial observation for scan-based logic BIST is known as one of effective methods to improve fault coverage without increase of test time. In the method, the selection of flip-flops for partial observation is critical to achieve high fault coverage with small area overhead. This paper proposes a selection method under the limitation to a number of flip-flops. The method consists of structural analysis of CUT and logic simulation of test vectors, therefore, it provides an easy implementation and a good scalability. Experimental results on benchmark circuits show that the method obtains higher fault coverage with less area overhead than the original method. Also the relation between the number of selected flip-flops and fault coverage is investigated.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_23_description_5":{"attribute_name":"備考","attribute_value_mlt":[{"subitem_description":"27th IEEE ASIAN TEST SYMPOSIUM (ATS'18), 15-18 October 2018, Hefei, China","subitem_description_type":"Other"}]},"item_23_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"lang":"ja"}]}]}]},"item_23_link_61":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/201_ja.html"}]},"item_23_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_23_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/ATS.2018.00017","subitem_relation_type_select":"DOI"}}]},"item_23_relation_9":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-5386-9466-4","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-5386-9467-1","subitem_relation_type_select":"ISBN"}}]},"item_23_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works."}]},"item_23_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_23_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2377-5386","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"1081-7735","subitem_source_identifier_type":"PISSN"}]},"item_23_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10345121"}]},"item_23_text_62":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8027"}]},"item_23_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAlternatives":[{}],"creatorNames":[{"creatorName":"Oshima, Shigeyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{}],"creatorNames":[{"creatorName":"Kato, Takaaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{}],"creatorNames":[{"creatorName":"Wang, Senling","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAlternatives":[{}],"creatorNames":[{"creatorName":"Sato, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-09"}],"displaytype":"detail","filename":"ATS.2018.00017.pdf","filesize":[{"value":"432.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ATS.2018.00017.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6307/files/ATS.2018.00017.pdf"},"version_id":"9ccb9058-e075-42d6-8c50-01407245e72b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"logic BIST","subitem_subject_scheme":"Other"},{"subitem_subject":"scan test","subitem_subject_scheme":"Other"},{"subitem_subject":"multi-cycle test","subitem_subject_scheme":"Other"},{"subitem_subject":"partial observation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST","subitem_title_language":"en"}]},"item_type_id":"23","owner":"3","path":["20"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-01-09"},"publish_date":"2020-01-09","publish_status":"0","recid":"6307","relation_version_is_last":true,"title":["On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-08T04:18:32.097974+00:00"}