{"created":"2023-05-15T11:59:44.293616+00:00","id":6309,"links":{},"metadata":{"_buckets":{"deposit":"2d844f0d-2fb6-4e61-abdd-95b15439642f"},"_deposit":{"created_by":3,"id":"6309","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6309"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006309","sets":["8:24"]},"author_link":["1143"],"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-10-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicPageEnd":"505","bibliographicPageStart":"498","bibliographicVolumeNumber":"31","bibliographic_titles":[{"bibliographic_title":"日本信頼性学会誌"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"LSIの大規模化,微細化,高速化,及び低電圧化に伴い,テスト時の信号劣化が深刻な問題になってきている.信号劣化は誤ったテスト結果を引き起こし,歩留りを低下させる危険性を持っている.本稿では,まずLSIテストに多用されるスキャン方式を説明し,それに関連する様々なシグナルインテグリティ問題を明らかにする.次に,シグナルインテグリティ問題の1つである電源ノイズの原因となるIRドロップを削減する技術を紹介する.最後に,種々のシグナルインテグリティ問題を体系的に解決するSIAT(Signal-Integrity-Aware 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