@article{oai:kyutech.repo.nii.ac.jp:00006318,
 author = {Yamato, Yuta and Nakamura, Yusuke and Miyase, Kohei and 宮瀬, 紘平 and Wen, Xiaoqing and 温, 暁青 and Kajihara, Seiji and 梶原, 誠司},
 issue = {3},
 journal = {IEICE Transactions on Information and Systems},
 month = {Mar},
 note = {Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of non-deterministic logic behavior. However, the extensive use of vias and buffers in a deep-submicron circuit and the unpredictable order relation among threshold voltages at the fanout branches of a gate have not been fully addressed by conventional per-test X-fault diagnosis. To take these factors into consideration, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and buffers and (2) the use of occurrence probabilities of logic behaviors for a physical defect to handle the unpredictable relation among threshold voltages. Experimental results show the effectiveness of the proposed method.},
 pages = {667--674},
 title = {A Novel Per-Test Fault Diagnosis Method Based On the Extended X-Fault Model for Deep-Submicron LSI Circuits},
 volume = {E91.D},
 year = {2008},
 yomi = {ミヤセ, コウヘイ and オン, ギョウセイ and カジハラ, セイジ}
}