@article{oai:kyutech.repo.nii.ac.jp:00006319,
 author = {Miyase, Kohei and 宮瀬, 紘平 and Terashima,  Kenta and Wen, Xiaoqing and 温, 暁青 and Kajihara, Seiji and 梶原, 誠司 and Reddy,  Sudhakar M.},
 issue = {3},
 journal = {IEICE Transactions on Information and Systems},
 month = {Mar},
 note = {If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.},
 pages = {683--689},
 title = {On Detection of Bridge Defects with Stuck-at Tests},
 volume = {E91.D},
 year = {2008},
 yomi = {ミヤセ, コウヘイ and オン, ギョウセイ and カジハラ, セイジ}
}