@article{oai:kyutech.repo.nii.ac.jp:00006321,
 author = {Yamato, Yuta and Wen, Xiaoqing and 温, 暁青 and Miyase, Kohei and 宮瀬, 紘平 and Furukawa, Hiroshi and Kajihara, Seiji and 梶原, 誠司},
 issue = {4},
 journal = {IEICE Transactions on Information and Systems},
 month = {Apr},
 note = {Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the ability of previous X-filling methods to reduce launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this reduction quality problem with a novel GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on both benchmark and industrial circuits, and the results have demonstrated the usefulness of GA-fill.},
 pages = {833--840},
 title = {A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing},
 volume = {E94.D},
 year = {2011},
 yomi = {オン, ギョウセイ and ミヤセ, コウヘイ and カジハラ, セイジ}
}