@article{oai:kyutech.repo.nii.ac.jp:00006322,
 author = {Miyase, Kohei and 宮瀬, 紘平 and Noda, Kenji and Ito, Hideaki and Hatayama, Kazumi and Aikyo, Takashi and Yamato, Yuta and Furukawa, Hiroshi and Wen, Xiaoqing and 温, 暁青 and Kajihara, Seiji and 梶原, 誠司},
 issue = {6},
 journal = {IEICE Transactions on Information and Systems},
 month = {Jun},
 note = {Test data modification based on test relaxation and X-filling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size.},
 pages = {1216--1226},
 title = {Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing},
 volume = {E94.D},
 year = {2011},
 yomi = {ミヤセ, コウヘイ and オン, ギョウセイ and カジハラ, セイジ}
}