{"created":"2023-05-15T11:59:44.855904+00:00","id":6322,"links":{},"metadata":{"_buckets":{"deposit":"036eba77-c727-4c7d-97d8-4c7944d5da49"},"_deposit":{"created_by":3,"id":"6322","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6322"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006322","sets":["8:24"]},"author_link":["6567","26147","26148","26149","26150","26151","26152","1143","1147"],"control_number":"6322","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1390282679354636928","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-06-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"1226","bibliographicPageStart":"1216","bibliographicVolumeNumber":"E94.D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Test data modification based on test relaxation and X-filling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1587/transinf.E94.D.1216","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2011 The Institute of Electronics, Information and Communication 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