{"created":"2023-05-15T11:59:44.939445+00:00","id":6324,"links":{},"metadata":{"_buckets":{"deposit":"49cc6ad2-6156-4aeb-887a-ae010545ba83"},"_deposit":{"created_by":3,"id":"6324","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6324"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006324","sets":["8:24"]},"author_link":["26175","1147","26177","6567","1143"],"control_number":"6324","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1390001205263700480","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-08-16","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"291","bibliographicPageStart":"283","bibliographicVolumeNumber":"3","bibliographic_titles":[{"bibliographic_title":"IPSJ Transactions on System LSI Design Methodology","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper proposes a method to compute delay values in 3-valued fault simulation for test cubes which are test patterns with unspecified values (Xs). Because the detectable delay size of each fault by a test cube is not fixed before assigning logic values to the Xs in the test cube, the proposed method only computes a range of the detectable delay values of the test patterns covered by the test cubes. By using the proposed method, we derive the lowest and the highest test quality of test patterns covered by the test cubes. Furthermore, we also propose a GA (genetic algorithm)-based method to generate fully specified test patterns with high test quality from test cubes. Experimental results for benchmark circuits show the effectiveness of the proposed methods.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.2197/ipsjtsldm.3.283","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2010 by the Information Processing Society of Japan"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA12394951","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-6687","subitem_source_identifier_type":"EISSN"}]},"item_21_subject_16":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549","subitem_subject_scheme":"NDC"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10029834"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8046"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAlternatives":[{"creatorAlternative":"Oku, S.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Oku, Shinji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Kajihara, Seiji","creatorNameLang":"en"},{"creatorName":"梶原, 誠司","creatorNameLang":"ja"},{"creatorName":"カジハラ, セイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAlternatives":[{"creatorAlternative":"Sato, Y.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Sato, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Miyase, Kohei","creatorNameLang":"en"},{"creatorName":"宮瀬, 紘平","creatorNameLang":"ja"},{"creatorName":"ミヤセ, コウヘイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAffiliations":[{"affiliationNames":[{}]}],"creatorNames":[{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"温, 暁青","creatorNameLang":"ja"},{"creatorName":"オン, ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"ipsjtsldm.3.283.pdf","filesize":[{"value":"714.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ipsjtsldm.3.283.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6324/files/ipsjtsldm.3.283.pdf"},"version_id":"39c216c5-2003-4ca7-a0be-8a8ca9c201b3"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"On Delay Test Quality for Test Cubes","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Delay Test Quality for Test Cubes","subitem_title_language":"en"}]},"item_type_id":"21","owner":"3","path":["24"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-01-16"},"publish_date":"2020-01-16","publish_status":"0","recid":"6324","relation_version_is_last":true,"title":["On Delay Test Quality for Test Cubes"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-22T02:52:10.675191+00:00"}