{"created":"2023-05-15T11:59:44.981384+00:00","id":6325,"links":{},"metadata":{"_buckets":{"deposit":"22233104-ef25-43bb-bbda-a34f1ca11b45"},"_deposit":{"created_by":3,"id":"6325","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6325"},"status":"published"},"_oai":{"id":"oai:kyutech.repo.nii.ac.jp:00006325","sets":["8:24"]},"author_link":["26185","26186","26187","26188","1143","26190"],"control_number":"6325","item_1689815586683":{"attribute_name":"CRID","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://cir.nii.ac.jp/crid/1390282679355791232","subitem_relation_type_select":"URI"}}]},"item_21_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"2681","bibliographicPageStart":"2672","bibliographicVolumeNumber":"E99.D","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Information and Systems","bibliographic_titleLang":"en"}]}]},"item_21_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. However, the test patterns generated by LFSR reseeding generally have high toggle rate and thus cause high test power. Therefore, it is feasible to fill X bits in deterministic test cubes with 0 or 1 properly before encoding the seed to reduce toggle rate. However, X-filling will increase the number of specified bits, thus increase the difficulty of seed encoding, what's more, the size of LFSR will increase as well. This paper presents a test frame which takes into consideration both compression ratio and power consumption simultaneously. In the first stage, the proposed reseeding-oriented X-filling proceeds for shift power (shift filling) and capture power (capture filling) reduction. Then, encode the filled test cubes using the proposed Compatible Block Code (CBC). The CBC can X-ize specified bits, namely turning specified bits into X bits, and can resolve the conflict between low-power filling and seed encoding. Experiments performed on ISCAS'89 benchmark circuits show that our scheme attains a compression ratio of 94.1% and reduces capture power by at least 15% and scan-in power by more than 79.5%.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_21_link_62":{"attribute_name":"研究者情報","attribute_value_mlt":[{"subitem_link_url":"https://hyokadb02.jimu.kyutech.ac.jp/html/300_ja.html"}]},"item_21_publisher_7":{"attribute_name":"出版社","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会","subitem_publisher_language":"ja"}]},"item_21_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1587/transinf.2015EDP7289","subitem_relation_type_select":"DOI"}}]},"item_21_rights_13":{"attribute_name":"著作権関連情報","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2016 The Institute of Electronics, Information and Communication Engineers"}]},"item_21_select_59":{"attribute_name":"査読の有無","attribute_value_mlt":[{"subitem_select_item":"yes"}]},"item_21_source_id_10":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA10826272","subitem_source_identifier_type":"NCID"}]},"item_21_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1745-1361","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"0916-8532","subitem_source_identifier_type":"PISSN"}]},"item_21_text_28":{"attribute_name":"論文ID（連携）","attribute_value_mlt":[{"subitem_text_value":"10302948"}]},"item_21_text_63":{"attribute_name":"連携ID","attribute_value_mlt":[{"subitem_text_value":"8047"}]},"item_21_version_type_58":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAlternatives":[{"creatorAlternative":"Chen, 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ギョウセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{},{},{}]},{"creatorAlternatives":[{"creatorAlternative":"Wang, W.","creatorAlternativeLang":"en"}],"creatorNames":[{"creatorName":"Wang, Wei","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-16"}],"displaytype":"detail","filename":"transinf.2015EDP7289.pdf","filesize":[{"value":"2.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"transinf.2015EDP7289.pdf","url":"https://kyutech.repo.nii.ac.jp/record/6325/files/transinf.2015EDP7289.pdf"},"version_id":"91b3d49e-1867-4ed4-a6c5-300705d34c11"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"low power test","subitem_subject_scheme":"Other"},{"subitem_subject":"data compression","subitem_subject_scheme":"Other"},{"subitem_subject":"LFSR","subitem_subject_scheme":"Other"},{"subitem_subject":"X-filling","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression 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