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Static Noise Margin Evaluation Method Based on Direct Polynomial-Curve-Fitting with Universal SRAM Cell Inverter TEG Measurement
http://hdl.handle.net/10228/00007541
http://hdl.handle.net/10228/00007541df096962-2c84-4e3d-a298-ea6921a3de3c
| 名前 / ファイル | ライセンス | アクション |
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10060261.pdf (599.2 kB)
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| アイテムタイプ | 会議発表論文 = Conference Paper(1) | |||||||||||
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| 公開日 | 2020-01-20 | |||||||||||
| 資源タイプ | ||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||||||||
| 資源タイプ | conference paper | |||||||||||
| タイトル | ||||||||||||
| タイトル | Static Noise Margin Evaluation Method Based on Direct Polynomial-Curve-Fitting with Universal SRAM Cell Inverter TEG Measurement | |||||||||||
| 言語 | en | |||||||||||
| 言語 | ||||||||||||
| 言語 | eng | |||||||||||
| 著者 |
中村, 和之
× 中村, 和之
WEKO
26231
× Noda, Kazunori× Koike, Hiroki |
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| 抄録 | ||||||||||||
| 内容記述タイプ | Abstract | |||||||||||
| 内容記述 | A new method to evaluate the static noise margin (SNM) for leading-edge CMOS SRAM development is proposed. This method includes: (1) direct measurement of the inverter DC transfer curves using a "universal SRAM cell inverter TEG (USCIT)" with arbitrary transistor ratios, (2) curve-fitting of the measured data to polynomial functions in a 45-degree rotated space, and (3) a database of the polynomial coefficients to evaluate and optimize the SNM by a simple algebraic operation. The SNM values obtained using this method are in good agreement with the measured SRAM operations. | |||||||||||
| 言語 | en | |||||||||||
| 備考 | ||||||||||||
| 内容記述タイプ | Other | |||||||||||
| 内容記述 | 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS), 30 March-2 April 2009, Oxnard, CA, USA | |||||||||||
| 書誌情報 |
en : 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) 発行日 2009-04-14 |
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| 出版社 | ||||||||||||
| 出版社 | IEEE | |||||||||||
| DOI | ||||||||||||
| 関連タイプ | isVersionOf | |||||||||||
| 識別子タイプ | DOI | |||||||||||
| 関連識別子 | https://doi.org/10.1109/ICMTS.2009.4814599 | |||||||||||
| ISBN | ||||||||||||
| 識別子タイプ | ISBN | |||||||||||
| 関連識別子 | 978-1-4244-4259-1 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||
| 収録物識別子 | 2158-1029 | |||||||||||
| ISSN | ||||||||||||
| 収録物識別子タイプ | PISSN | |||||||||||
| 収録物識別子 | 1071-9032 | |||||||||||
| 著作権関連情報 | ||||||||||||
| 権利情報 | Copyright (c) 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||||
| 出版タイプ | ||||||||||||
| 出版タイプ | AM | |||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||||
| 査読の有無 | ||||||||||||
| 値 | yes | |||||||||||
| 研究者情報 | ||||||||||||
| URL | https://hyokadb02.jimu.kyutech.ac.jp/html/381_ja.html | |||||||||||
| 論文ID（連携） | ||||||||||||
| 値 | 10060261 | |||||||||||
| 連携ID | ||||||||||||
| 値 | 8053 | |||||||||||
